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SEM, EDAX & AFM study of ZnTe films deposited using SILAR method - Couverture souple

Rathod, Jignesh

 
9783659258299: SEM, EDAX & AFM study of ZnTe films deposited using SILAR method
Couverture souple
ISBN 10 : 3659258296 ISBN 13 : 9783659258299
Editeur : LAP LAMBERT Academic Publishing, 2014

Synopsis

In present book, AFM has been used to measure surface morphology. For microanalysis the scanning electron microscope (SEM) has been used. The scanning electron microscope (SEM), which is closely related to the electron probe, is designed primarily for producing electron images, but can also be used for elements mapping, and even point analysis.Scanning electron microscopes which are equipped with EDS (Energy Dispersed Spectroscopy) or EDAX (Energy-Dispersed Analysis of X-rays) detectors that capture the emitted X-ray is used for elemental analysis. The results, analysis and conclusions of ZnTe thin films deposited by SILAR method at various thicknesses and annealing temperatures have been carried out in detail and are presented in this book.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

In present book, AFM has been used to measure surface morphology. For microanalysis the scanning electron microscope (SEM) has been used. The scanning electron microscope (SEM), which is closely related to the electron probe, is designed primarily for producing electron images, but can also be used for elements mapping, and even point analysis.Scanning electron microscopes which are equipped with EDS (Energy Dispersed Spectroscopy) or EDAX (Energy-Dispersed Analysis of X-rays) detectors that capture the emitted X-ray is used for elemental analysis. The results, analysis and conclusions of ZnTe thin films deposited by SILAR method at various thicknesses and annealing temperatures have been carried out in detail and are presented in this book.

Biographie de l'auteur

Jignesh Rathod has done M.Sc(Solid State Electronics)& M.Phil(Thin Film Technology)from S.P.University. He has been pursuing doctorate degree in thin film technology under the guidance of Prof.V.M.Pathak. He has been published many papers in renowned international journals,conferences &seminars.He has also worked as faculty in Engineering Colleges.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2014
Langue
anglais
ISBN 10 
3659258296
ISBN 13 
9783659258299
Reliure
Broché
Nombre de pages
64
Coordonnées du fabricant
non disponible
Personne responsable
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