Testing of ASIC and FPGA circuits: VLSI testing and verification - Couverture souple

Raj, Sumit

 
9783659275852: Testing of ASIC and FPGA circuits: VLSI testing and verification
Couverture souple
ISBN 10 : 3659275859 ISBN 13 : 9783659275852
Editeur : LAP LAMBERT Academic Publishing, 2012

Synopsis

This is my first book, related to my masters thesis work. In this book I have mentioned my research work on faster approach towards testing of VLSI design. This book is not limited to only my approach in testing, but whole ASIC and FPGA testing methods are given in brief. So this book can be used for general study related to VLSI testing. I hope this book enhance your knowledge in VLSI testing field.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

This is my first book, related to my masters thesis work. In this book I have mentioned my research work on faster approach towards testing of VLSI design. This book is not limited to only my approach in testing, but whole ASIC and FPGA testing methods are given in brief. So this book can be used for general study related to VLSI testing. I hope this book enhance your knowledge in VLSI testing field.

Biographie de l'auteur

I have done B.Tech in electornics and MS by research in VLSI testing from IIIT Hyderabad, India.Currently I am working for nVIDIA graphics as hardware engg in dft team.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2012
Langue
anglais
ISBN 10 
3659275859
ISBN 13 
9783659275852
Reliure
Broché
Nombre de pages
160
Coordonnées du fabricant
non disponible
Personne responsable
KreGa Onlinehandel GmbH
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