On-Chip Time-Domain Metrology in Submicron CMOS - Couverture souple

Lin, Chin-Hsin

 
9783659308208: On-Chip Time-Domain Metrology in Submicron CMOS
Couverture souple
ISBN 10 : 365930820X ISBN 13 : 9783659308208
Editeur : LAP LAMBERT Academic Publishing, 2012

Synopsis

As the complexity and operational speed of today's Systems-on-Chip increase, measuring and characterizing SoC’s building blocks are becoming more challenging. Embedded measuring techniques for system characterization, such as built-in self-test, are therefore becoming necessities. A Time-to-Digital Converter (TDC) is a device that has been widely used to measure the time intervals between two signal edges. The measurement resolution of a simple TDC architecture is limited by the minimum gate delay in the IC fabrication process. When the required time measurement resolution is smaller than the minimum gate delay, many TDC architectures include Time Difference Amplifiers (TDA) to pre-amplify the very short input time intervals. However, the gain of the TDA is usually sensitive to process, voltage, and temperature variations. This work researches techniques on improving measurement characteristic of TDCs and demonstrates a single-stage Vernier TDC with a constant gain TDA. The final designed TDC architecture achieves a linear measurement with a 2.5ps time resolution.

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Présentation de l'éditeur

As the complexity and operational speed of today's Systems-on-Chip increase, measuring and characterizing SoC’s building blocks are becoming more challenging. Embedded measuring techniques for system characterization, such as built-in self-test, are therefore becoming necessities. A Time-to-Digital Converter (TDC) is a device that has been widely used to measure the time intervals between two signal edges. The measurement resolution of a simple TDC architecture is limited by the minimum gate delay in the IC fabrication process. When the required time measurement resolution is smaller than the minimum gate delay, many TDC architectures include Time Difference Amplifiers (TDA) to pre-amplify the very short input time intervals. However, the gain of the TDA is usually sensitive to process, voltage, and temperature variations. This work researches techniques on improving measurement characteristic of TDCs and demonstrates a single-stage Vernier TDC with a constant gain TDA. The final designed TDC architecture achieves a linear measurement with a 2.5ps time resolution.

Biographie de l'auteur

Chin-Hsin Eddy Lin received the B.A.Sc degree in electrical engineering from the University of British Columbia, Vancouver, Canada in 2008 and the M.A.Sc. degree in electrical engineering from Simon Fraser University, Burnaby, Canada in 2012. He is currently a system validation design engineer at PMC-Sierra.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2012
Langue
anglais
ISBN 10 
365930820X
ISBN 13 
9783659308208
Reliure
Broché
Nombre de pages
96
Coordonnées du fabricant
non disponible
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