Dynamic Laser Stimulation: Timing Analysis of Tester Operated Integrated Circuits Stimulated by an Infra-Red Laser - Couverture souple

Kiyan, Tuba

 
9783659338625: Dynamic Laser Stimulation: Timing Analysis of Tester Operated Integrated Circuits Stimulated by an Infra-Red Laser
Couverture souple
ISBN 10 : 3659338621 ISBN 13 : 9783659338625
Editeur : LAP LAMBERT Academic Publishing, 2013

Synopsis

It is assumed that dynamic analysis of ICs will keep on progressing especially due to the increasing clock rates. Operation in higher frequency ranges requires a high-level quality delay testing capability. Dynamic Laser Stimulation techniques allow timing analysis of devices. CMOS devices, like delay chains and scan chains are investigated by DLS techniques. In order to detect very small laser-induced propagation delay variations with high resolution on the delay chains, different experimental setups are built and they are compared considering the acquisition time and signal quality. Moreover, it is demonstrated that the pulsed laser can suppress the laser induced secondary effects in opposition to the continuous wave laser. For the timing analysis of ICs, a new and systematic method is developed, which uses “soft fault injection” phenomenon on the scan chains. It can identify the most sensitive signal condition to the laser stimulation by using 1064 nm pulsed laser beam.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

It is assumed that dynamic analysis of ICs will keep on progressing especially due to the increasing clock rates. Operation in higher frequency ranges requires a high-level quality delay testing capability. Dynamic Laser Stimulation techniques allow timing analysis of devices. CMOS devices, like delay chains and scan chains are investigated by DLS techniques. In order to detect very small laser-induced propagation delay variations with high resolution on the delay chains, different experimental setups are built and they are compared considering the acquisition time and signal quality. Moreover, it is demonstrated that the pulsed laser can suppress the laser induced secondary effects in opposition to the continuous wave laser. For the timing analysis of ICs, a new and systematic method is developed, which uses “soft fault injection” phenomenon on the scan chains. It can identify the most sensitive signal condition to the laser stimulation by using 1064 nm pulsed laser beam.

Biographie de l'auteur

Dr. Tuba KIYAN received B.Sc. and M.Sc. degrees in Electronics Engineereing from Yildiz Technical University, Istanbul with focus on semiconductor devices. She had her PhD in Berlin University of Technology in 2010. Currently, she is working as a scientist and lecturer in Yildiz Technical University.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2013
Langue
anglais
ISBN 10 
3659338621
ISBN 13 
9783659338625
Reliure
Broché
Nombre de pages
196
Coordonnées du fabricant
non disponible
Personne responsable
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