Articles liés à Soft Error Tolerant System

Soft Error Tolerant System - Couverture souple

Uddin, Md. Nazim

 
9783659339158: Soft Error Tolerant System
Couverture souple
ISBN 10 : 3659339156 ISBN 13 : 9783659339158
Editeur : LAP LAMBERT Academic Publishing, 2013

Synopsis

Soft error is a significant reliability concern for nanometer technologies. Shrinking feature sizes, lower voltage levels, reduced noise margins, and increased clock frequency improves the performance and lowers the power consumption of integrated circuit. But it causes the integrated circuit more susceptible to soft error that can corrupt data and make systems vulnerable. The ‘device shrinking’ reduces the soft error tolerance of the VLSI circuits, as very little energy is needed to change their states. In digital systems, where the reliability is a great concern, the impact of soft errors may be very catastrophic. Safety critical systems are very sensitive to soft errors. A bit flip due to soft error can change the value of critical variable. And consequently the system control flow can completely be changed which may lead to system failure. To minimize the soft error risks, critical blocks are identified by criticality analysis of the blocks and ranking among them. Highest ranked blocks are considered as critical block. Refactoring is applied to minimize the criticality of the critical blocks. Then a novel methodology is proposed to detect and recover from soft errors.

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Présentation de l'éditeur

Soft error is a significant reliability concern for nanometer technologies. Shrinking feature sizes, lower voltage levels, reduced noise margins, and increased clock frequency improves the performance and lowers the power consumption of integrated circuit. But it causes the integrated circuit more susceptible to soft error that can corrupt data and make systems vulnerable. The ‘device shrinking’ reduces the soft error tolerance of the VLSI circuits, as very little energy is needed to change their states. In digital systems, where the reliability is a great concern, the impact of soft errors may be very catastrophic. Safety critical systems are very sensitive to soft errors. A bit flip due to soft error can change the value of critical variable. And consequently the system control flow can completely be changed which may lead to system failure. To minimize the soft error risks, critical blocks are identified by criticality analysis of the blocks and ranking among them. Highest ranked blocks are considered as critical block. Refactoring is applied to minimize the criticality of the critical blocks. Then a novel methodology is proposed to detect and recover from soft errors.

Biographie de l'auteur

Md. Nazim Uddin received M.Sc. Eng. in Computer Science and Engineering (Ph.D on going) from Khulna University of Engineering and Technology, Bangladesh in 2012. He is the Member of The Institute of Engineers(IEB). He has published around 6 papers and book chapters in his area of expertise. His current research interests are in Embedded Systems.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2013
Langue
anglais
ISBN 10 
3659339156
ISBN 13 
9783659339158
Reliure
Broché
Nombre de pages
72
Coordonnées du fabricant
non disponible
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