Le « test de durée de vie accéléré » implique l'accélération des défaillances dans le seul but de « quantifier les caractéristiques de vie du produit dans des conditions normales d'utilisation ». Ce livre concerne uniquement ce type de test de durée de vie accéléré. Au cours des dernières décennies, le statisticien et d'autres chercheurs se sont concentrés sur les tests de vie en utilisant des modèles de probabilité. Les paramètres impliqués dans les modèles avaient généralement été estimés par méthode de moment et de probabilité maximale. La littérature citée ci-dessus a indiqué sur les tests de vie en utilisant des distributions de probabilité. La présente enquête a été entreprise en prenant la fonction de densité de probabilité de la distribution exponentielle et de Weibull pour déterminer l'équation générale pour la fonction de taux d'échec et la distribution du temps de défaillance, et également l'étude de la durée de vie moyenne du système à travers ces distributions. La fonction de taux d'échec de la distribution exponentielle est . Ainsi, la fonction de taux d'échec pour la distribution exponentielle est constante. Le paramètre est souvent appelé le taux de distribution, qui est également connu sous le nom de propriété moins de mémoire.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -'Accelerated life testing' involves acceleration of failures with the single purpose of the 'quantification of the life characteristics of the product at normal use conditions.' This book is solely concerned with this type of accelerated life testing. During the last few decades, the statistician and other researchers had been concentrated about life testing using probability models. The parameters involved in the models usually had been estimated by method of moment and maximum likelihood. The literature cited above indicated about the life testing using probability distributions. The present investigation was undertaken by taking the probability density function of exponential and Weibull distribution to determine general equation for failure rate function and failure time distribution, and also the study of mean life of the system through these distributions.The failure rate function of exponential distribution is . Thus, the failure rate function for the exponential distribution is constant. The parameter is often referred to as the rate of the distribution, which is also known as memory less property. 56 pp. Englisch. N° de réf. du vendeur 9783659349140
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Mishra PradeepThe author of this book Mr.Pradeep Mishra S/o Shri Dinesh Prasad Mishra and Smt.Suman Mishra was born on 21st Feb. 1987 at Rewa (M.P.). He has Completed his Ph.D and M.Sc in (Agricultural statistics).And He have publish. N° de réf. du vendeur 18361293
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Taschenbuch. Etat : Neu. Neuware -'Accelerated life testing' involves acceleration of failures with the single purpose of the 'quantification of the life characteristics of the product at normal use conditions.' This book is solely concerned with this type of accelerated life testing. During the last few decades, the statistician and other researchers had been concentrated about life testing using probability models. The parameters involved in the models usually had been estimated by method of moment and maximum likelihood. The literature cited above indicated about the life testing using probability distributions. The present investigation was undertaken by taking the probability density function of exponential and Weibull distribution to determine general equation for failure rate function and failure time distribution, and also the study of mean life of the system through these distributions.The failure rate function of exponential distribution is . Thus, the failure rate function for the exponential distribution is constant. The parameter is often referred to as the rate of the distribution, which is also known as memory less property.Books on Demand GmbH, Überseering 33, 22297 Hamburg 56 pp. Englisch. N° de réf. du vendeur 9783659349140
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Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - 'Accelerated life testing' involves acceleration of failures with the single purpose of the 'quantification of the life characteristics of the product at normal use conditions.' This book is solely concerned with this type of accelerated life testing. During the last few decades, the statistician and other researchers had been concentrated about life testing using probability models. The parameters involved in the models usually had been estimated by method of moment and maximum likelihood. The literature cited above indicated about the life testing using probability distributions. The present investigation was undertaken by taking the probability density function of exponential and Weibull distribution to determine general equation for failure rate function and failure time distribution, and also the study of mean life of the system through these distributions.The failure rate function of exponential distribution is . Thus, the failure rate function for the exponential distribution is constant. The parameter is often referred to as the rate of the distribution, which is also known as memory less property. N° de réf. du vendeur 9783659349140
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Taschenbuch. Etat : Neu. Life testing using probability distributions | Pradeep Mishra | Taschenbuch | Paperback | 56 S. | Englisch | 2015 | LAP Lambert Academic Publishing | EAN 9783659349140 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu. N° de réf. du vendeur 104817959
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