Integrated Digital Thermometer in a BiCMOS Technology - Couverture souple

Aamir, Muhammad Fahim

 
9783659433375: Integrated Digital Thermometer in a BiCMOS Technology
Couverture souple
ISBN 10 : 3659433373 ISBN 13 : 9783659433375
Editeur : LAP LAMBERT Academic Publishing, 2013

Synopsis

In this work, an integrated digital thermometer was designed at transistor level in 0.18μm BiCMOS SiGe technology for a temperature range of -50 ˚C to 130 ˚C. The 1σ accuracy achieved at 100 ˚C is 1.21 ˚C. The digital thermometer consists of temperature sensor, Instrumentation amplifier (pre-amplifier), Sample-and-Hold, Comparator, Successive Approximation Register (SAR) and Digital-to-Analog Converter (DAC). The ADC designed is a successive approximation register (SAR) ADC having a sampling rate of 5 kS/s at 3V. The main thrust of this work was to have a minimum error. As the major error source is the sensor, three different sensor topologies were designed, tested and evaluated for minimum error and size. Monte Carlo simulations were performed to check for the process and mismatch variations. The data from Monte Carlo simulation was then used to measure the error.

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Présentation de l'éditeur

In this work, an integrated digital thermometer was designed at transistor level in 0.18μm BiCMOS SiGe technology for a temperature range of -50 ˚C to 130 ˚C. The 1σ accuracy achieved at 100 ˚C is 1.21 ˚C. The digital thermometer consists of temperature sensor, Instrumentation amplifier (pre-amplifier), Sample-and-Hold, Comparator, Successive Approximation Register (SAR) and Digital-to-Analog Converter (DAC). The ADC designed is a successive approximation register (SAR) ADC having a sampling rate of 5 kS/s at 3V. The main thrust of this work was to have a minimum error. As the major error source is the sensor, three different sensor topologies were designed, tested and evaluated for minimum error and size. Monte Carlo simulations were performed to check for the process and mismatch variations. The data from Monte Carlo simulation was then used to measure the error.

Biographie de l'auteur

Received BS in Computer Engineering from COMSATS institute of information technology, Pakistan in 2007 and MS in Wireless Networks & Electronics from Linköping University, Sweden in 2013.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2013
Langue
anglais
ISBN 10 
3659433373
ISBN 13 
9783659433375
Reliure
Broché
Nombre de pages
124
Coordonnées du fabricant
non disponible
Personne responsable
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