In this book is presented the preparation of Tellurium and Tellurium oxide thin films by cold spray process on different substrates at different deposition angles using helium gas as cold spray process and powder carrier gas without employing any catalyst. Characterization of the prepared thin films by X- ray diffraction analysis (XRD), and Scanning Electron Microscopy (SEM) in addition to Atomic Force Microscopy (AFM). The thin films exhibited a high transmission rate, which allows the products to have potential applications in transparent devices. Thus, the thin films demonstrated their potential application in low power consumption device for Ammonia gas sensor.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
In this book is presented the preparation of Tellurium and Tellurium oxide thin films by cold spray process on different substrates at different deposition angles using helium gas as cold spray process and powder carrier gas without employing any catalyst. Characterization of the prepared thin films by X- ray diffraction analysis (XRD), and Scanning Electron Microscopy (SEM) in addition to Atomic Force Microscopy (AFM). The thin films exhibited a high transmission rate, which allows the products to have potential applications in transparent devices. Thus, the thin films demonstrated their potential application in low power consumption device for Ammonia gas sensor.
Sinan Salman Hamdi Alhakeem is an assistant lecturer at the department of Materials Engineering, University of Technology in Baghdad, Iraq. He received the M.Sc. and B.Sc. degrees in Materials Engineering from University of Technology in 2006 and 2012 respectively.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In this book is presented the preparation of Tellurium and Tellurium oxide thin films by cold spray process on different substrates at different deposition angles using helium gas as cold spray process and powder carrier gas without employing any catalyst. Characterization of the prepared thin films by X- ray diffraction analysis (XRD), and Scanning Electron Microscopy (SEM) in addition to Atomic Force Microscopy (AFM). The thin films exhibited a high transmission rate, which allows the products to have potential applications in transparent devices. Thus, the thin films demonstrated their potential application in low power consumption device for Ammonia gas sensor. 88 pp. Englisch. N° de réf. du vendeur 9783659551093
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Vendeur : Books Puddle, New York, NY, Etats-Unis
Etat : New. pp. 88. N° de réf. du vendeur 26128178422
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Vendeur : Majestic Books, Hounslow, Royaume-Uni
Etat : New. Print on Demand pp. 88 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam. N° de réf. du vendeur 131360553
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Vendeur : moluna, Greven, Allemagne
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Alhakeem Sinan S. HamdiSinan Salman Hamdi Alhakeem is an assistant lecturer at the department of Materials Engineering, University of Technology in Baghdad, Iraq. He received the M.Sc. and B.Sc. degrees in Materials Engineering from . N° de réf. du vendeur 5164221
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Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
Etat : New. PRINT ON DEMAND pp. 88. N° de réf. du vendeur 18128178428
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Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -In this book is presented the preparation of Tellurium and Tellurium oxide thin films by cold spray process on different substrates at different deposition angles using helium gas as cold spray process and powder carrier gas without employing any catalyst. Characterization of the prepared thin films by X- ray diffraction analysis (XRD), and Scanning Electron Microscopy (SEM) in addition to Atomic Force Microscopy (AFM). The thin films exhibited a high transmission rate, which allows the products to have potential applications in transparent devices. Thus, the thin films demonstrated their potential application in low power consumption device for Ammonia gas sensor.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 88 pp. Englisch. N° de réf. du vendeur 9783659551093
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Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - In this book is presented the preparation of Tellurium and Tellurium oxide thin films by cold spray process on different substrates at different deposition angles using helium gas as cold spray process and powder carrier gas without employing any catalyst. Characterization of the prepared thin films by X- ray diffraction analysis (XRD), and Scanning Electron Microscopy (SEM) in addition to Atomic Force Microscopy (AFM). The thin films exhibited a high transmission rate, which allows the products to have potential applications in transparent devices. Thus, the thin films demonstrated their potential application in low power consumption device for Ammonia gas sensor. N° de réf. du vendeur 9783659551093
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