Articles liés à Development of conductive SPM probes for applications...

Development of conductive SPM probes for applications in Biology: SPM probes for Electrical and Topographic Characterizations of Samples at the Nanoscale Spatial Resolution - Couverture souple

Birhane, Yigezu Mulugeta

 
9783659778414: Development of conductive SPM probes for applications in Biology: SPM probes for Electrical and Topographic Characterizations of Samples at the Nanoscale Spatial Resolution
Couverture souple
ISBN 10 : 3659778419 ISBN 13 : 9783659778414
Editeur : LAP LAMBERT Academic Publishing, 2015

Synopsis

In this work novel Scanning Probe Microscopy (SPM) probes have been designed and batch fabricated using standard microfabrication technologies. The author emphasizes that the capacitance gradient data between the fabricated probes and a conductive substrate, Highly Ordered Pyrolytic Graphite (HOPG) taken as a function of tip-sample distance show an excellent agreement with the Hudlet formula, which only takes the capacitance contribution from the tip-sample interaction, in a long range of tip-sample distances (beyond 350 nm). This shows the stray capacitance contribution of the cantilever has been reduced to non-detectable limit. The author underscores that this work could be used as a starting material for future research in the development ultra sharp, and noise free conductive SPM probes for applications in Biology, nanolithography and etc.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

In this work novel Scanning Probe Microscopy (SPM) probes have been designed and batch fabricated using standard microfabrication technologies. The author emphasizes that the capacitance gradient data between the fabricated probes and a conductive substrate, Highly Ordered Pyrolytic Graphite (HOPG) taken as a function of tip-sample distance show an excellent agreement with the Hudlet formula, which only takes the capacitance contribution from the tip-sample interaction, in a long range of tip-sample distances (beyond 350 nm). This shows the stray capacitance contribution of the cantilever has been reduced to non-detectable limit. The author underscores that this work could be used as a starting material for future research in the development ultra sharp, and noise free conductive SPM probes for applications in Biology, nanolithography and etc.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2015
Langue
anglais
ISBN 10 
3659778419
ISBN 13 
9783659778414
Reliure
Broché
Nombre de pages
160
Coordonnées du fabricant
non disponible
Personne responsable
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