This book highlights the importance of optical characterization as a mean to reach high efficiencies in thin film solar cells. Characterization of the CZTSe cell material was performed using two approaches. Ellipsometry measurements were used to characterize thin flat layers while rough layers were characterized using a developed model. The proposed model is a mean of estimating the refractive index and the absorption coefficient of a rough material from a set of reflectance and transmission measurements. A simulation model was built based on the characterized optical parameters and was used to predict the optical behavior of the cell and optimize the whole stack optically. Optimization was focusing on minimizing the optical losses through first optimizing the thickness of each layer using the built simulation model and secondly optimizing the optical performance using Anti-Reflection Coating (ARC). Reflection values decreased from about 10% to values as low as 0.45% at the central wavelength with an average integrated reflection over the whole wavelength spectrum of interest of only 2%. These enhancements has lead to higher cell efficiencies with a certified record of 9.7 %.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
This book highlights the importance of optical characterization as a mean to reach high efficiencies in thin film solar cells. Characterization of the CZTSe cell material was performed using two approaches. Ellipsometry measurements were used to characterize thin flat layers while rough layers were characterized using a developed model. The proposed model is a mean of estimating the refractive index and the absorption coefficient of a rough material from a set of reflectance and transmission measurements. A simulation model was built based on the characterized optical parameters and was used to predict the optical behavior of the cell and optimize the whole stack optically. Optimization was focusing on minimizing the optical losses through first optimizing the thickness of each layer using the built simulation model and secondly optimizing the optical performance using Anti-Reflection Coating (ARC). Reflection values decreased from about 10% to values as low as 0.45% at the central wavelength with an average integrated reflection over the whole wavelength spectrum of interest of only 2%. These enhancements has lead to higher cell efficiencies with a certified record of 9.7 %.
Hossam Elanzeery is currently completing his PhD degree in University of Luxembourg with his Msc. and Bachelor degrees received from Nile University, Egypt (2014) and University of Technology Petronas, Malaysia (2010) respectively. His Master's thesis was completed in IMEC, Belgium. Hossam has more than 10 publications and 2 patents in solar cells.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book highlights the importance of optical characterization as a mean to reach high efficiencies in thin film solar cells. Characterization of the CZTSe cell material was performed using two approaches. Ellipsometry measurements were used to characterize thin flat layers while rough layers were characterized using a developed model. The proposed model is a mean of estimating the refractive index and the absorption coefficient of a rough material from a set of reflectance and transmission measurements. A simulation model was built based on the characterized optical parameters and was used to predict the optical behavior of the cell and optimize the whole stack optically. Optimization was focusing on minimizing the optical losses through first optimizing the thickness of each layer using the built simulation model and secondly optimizing the optical performance using Anti-Reflection Coating (ARC). Reflection values decreased from about 10% to values as low as 0.45% at the central wavelength with an average integrated reflection over the whole wavelength spectrum of interest of only 2%. These enhancements has lead to higher cell efficiencies with a certified record of 9.7 %. 96 pp. Englisch. N° de réf. du vendeur 9783659851506
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Vendeur : moluna, Greven, Allemagne
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: ElAnzeery HossamHossam Elanzeery is currently completing his PhD degree in University of Luxembourg with his Msc. and Bachelor degrees received from Nile University, Egypt (2014) and University of Technology Petronas, Malaysia (2010). N° de réf. du vendeur 159146338
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Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book highlights the importance of optical characterization as a mean to reach high efficiencies in thin film solar cells. Characterization of the CZTSe cell material was performed using two approaches. Ellipsometry measurements were used to characterize thin flat layers while rough layers were characterized using a developed model. The proposed model is a mean of estimating the refractive index and the absorption coefficient of a rough material from a set of reflectance and transmission measurements. A simulation model was built based on the characterized optical parameters and was used to predict the optical behavior of the cell and optimize the whole stack optically. Optimization was focusing on minimizing the optical losses through first optimizing the thickness of each layer using the built simulation model and secondly optimizing the optical performance using Anti-Reflection Coating (ARC). Reflection values decreased from about 10% to values as low as 0.45% at the central wavelength with an average integrated reflection over the whole wavelength spectrum of interest of only 2%. These enhancements has lead to higher cell efficiencies with a certified record of 9.7 %. N° de réf. du vendeur 9783659851506
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Vendeur : Revaluation Books, Exeter, Royaume-Uni
Paperback. Etat : Brand New. 96 pages. 8.66x5.91x0.22 inches. In Stock. N° de réf. du vendeur __3659851507
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Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book highlights the importance of optical characterization as a mean to reach high efficiencies in thin film solar cells. Characterization of the CZTSe cell material was performed using two approaches. Ellipsometry measurements were used to characterize thin flat layers while rough layers were characterized using a developed model. The proposed model is a mean of estimating the refractive index and the absorption coefficient of a rough material from a set of reflectance and transmission measurements. A simulation model was built based on the characterized optical parameters and was used to predict the optical behavior of the cell and optimize the whole stack optically. Optimization was focusing on minimizing the optical losses through first optimizing the thickness of each layer using the built simulation model and secondly optimizing the optical performance using Anti-Reflection Coating (ARC). Reflection values decreased from about 10% to values as low as 0.45% at the central wavelength with an average integrated reflection over the whole wavelength spectrum of interest of only 2%. These enhancements has lead to higher cell efficiencies with a certified record of 9.7 %.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 96 pp. Englisch. N° de réf. du vendeur 9783659851506
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Vendeur : preigu, Osnabrück, Allemagne
Taschenbuch. Etat : Neu. Advanced Light Management for CZTSe Alternative Thin Film Solar Cells | Hossam Elanzeery | Taschenbuch | 96 S. | Englisch | 2016 | LAP LAMBERT Academic Publishing | EAN 9783659851506 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. N° de réf. du vendeur 103806121
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Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
paperback. Etat : New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book. N° de réf. du vendeur ERICA82936598515076
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