A Fresh View on Impact Ionization Process: Multistage Scattering Model: Estimation of Ionization Rates of Charge Carriers in Different Semiconductors and in Monolayer Graphene Nanoribbons - Couverture souple

Acharyya, Aritra

 
9783659932595: A Fresh View on Impact Ionization Process: Multistage Scattering Model: Estimation of Ionization Rates of Charge Carriers in Different Semiconductors and in Monolayer Graphene Nanoribbons
Couverture souple
ISBN 10 : 3659932590 ISBN 13 : 9783659932595
Editeur : LAP LAMBERT Academic Publishing, 2017

Synopsis

This book is presenting a new way of looking into the well-known impact ionization phenomena in reverse biased p-n junctions. It is intended as a text for postgraduate students in applied physics, electrical and electronics engineering and material science. It can exclusively serve as a reference for the scientists who are working in the area of semiconductor device simulation and modeling. The analytical approach of representing impact ionization phenomena based on multistage scattering model will be extremely helpful for the researchers working in the above-mentioned areas of research. The procedure of estimating the ionization rate of charge carriers in different semiconductors and monolayer grapheme nanoribbons via multistage scattering model has been presented in different chapters of this book. The influences of acoustic phonon scattering as well as externally applied steady magnetic field on the ionization rates has also been described in detail in subsequent chapters.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

This book is presenting a new way of looking into the well-known impact ionization phenomena in reverse biased p-n junctions. It is intended as a text for postgraduate students in applied physics, electrical and electronics engineering and material science. It can exclusively serve as a reference for the scientists who are working in the area of semiconductor device simulation and modeling. The analytical approach of representing impact ionization phenomena based on multistage scattering model will be extremely helpful for the researchers working in the above-mentioned areas of research. The procedure of estimating the ionization rate of charge carriers in different semiconductors and monolayer grapheme nanoribbons via multistage scattering model has been presented in different chapters of this book. The influences of acoustic phonon scattering as well as externally applied steady magnetic field on the ionization rates has also been described in detail in subsequent chapters.

Biographie de l'auteur

Dr. Aritra Acharyya is currently working as an Assistant Professor of Department of ECE, Cooch Behar Government Engineering College, W.B., India. His research interests are high speed semiconductor devices, transport phenomena, etc. He has authored 5 books and more than 115 research papers in peer reviewed journals and conference proceedings.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2017
Langue
anglais
ISBN 10 
3659932590
ISBN 13 
9783659932595
Reliure
Broché
Nombre de pages
116
Coordonnées du fabricant
non disponible
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