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Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy - Couverture rigide
Synopsis
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
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À propos de l?auteur
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
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Scanning Probe Microscopy
Edité par
Springer Berlin Heidelberg, 2015
ISBN 10 : 3662452391
ISBN 13 : 9783662452394
Neuf
Couverture rigide
Vendeur : moluna, Greven, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. N° de réf. du vendeur 20937848
Quantité disponible : Plus de 20 disponibles
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Scanning Probe Microscopy : Atomic Force Microscopy and Scanning Tunneling Microscopy
Edité par
Springer Berlin Heidelberg, Springer Berlin Heidelberg, 2015
ISBN 10 : 3662452391
ISBN 13 : 9783662452394
Neuf
Couverture rigide
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. N° de réf. du vendeur 9783662452394
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
Scanning Probe Microscopy
Edité par
Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2015, 2015
ISBN 10 : 3662452391
ISBN 13 : 9783662452394
Neuf
Couverture rigide
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. 400 pp. Englisch. N° de réf. du vendeur 9783662452394
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
Scanning Probe Microscopy
Edité par
Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2015, 2015
ISBN 10 : 3662452391
ISBN 13 : 9783662452394
Neuf
Couverture rigide
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Buch. Etat : Neu. Neuware -This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 400 pp. Englisch. N° de réf. du vendeur 9783662452394
Quantité disponible : 1 disponible(s)