Articles liés à Handbook of Practical X-ray Fluorescence Analysis

Handbook of Practical X-ray Fluorescence Analysis - Couverture souple

 
9783662496015: Handbook of Practical X-ray Fluorescence Analysis

Synopsis

X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Acheter D'occasion

Zustand: Hervorragend | Sprache...
Afficher cet article
EUR 484,74

Autre devise

EUR 105 expédition depuis Allemagne vers Etats-Unis

Destinations, frais et délais

Acheter neuf

Afficher cet article
EUR 619,04

Autre devise

EUR 48,99 expédition depuis Allemagne vers Etats-Unis

Destinations, frais et délais

Autres éditions populaires du même titre

9783540286035: Handbook of Practical X-ray Fluorescence Analysis

Edition présentée

ISBN 10 :  3540286039 ISBN 13 :  9783540286035
Editeur : Springer-Verlag Berlin and Heide..., 2006
Couverture rigide

Résultats de recherche pour Handbook of Practical X-ray Fluorescence Analysis

Image d'archives

Unbekannt
Edité par Springer Berlin Heidelberg, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Ancien ou d'occasion Couverture souple

Vendeur : Buchpark, Trebbin, Allemagne

Évaluation du vendeur 5 sur 5 étoiles Evaluation 5 étoiles, En savoir plus sur les évaluations des vendeurs

Etat : Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher. N° de réf. du vendeur 29515687/1

Contacter le vendeur

Acheter D'occasion

EUR 484,74
Autre devise
Frais de port : EUR 105
De Allemagne vers Etats-Unis
Destinations, frais et délais

Quantité disponible : 1 disponible(s)

Ajouter au panier

Image fournie par le vendeur

Beckhoff, Burkhard|Kanngießer, Birgit|Langhoff, Norbert|Wedell, Reiner|Wolff, Helmut
Edité par Springer Berlin Heidelberg, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Neuf Couverture souple
impression à la demande

Vendeur : moluna, Greven, Allemagne

Évaluation du vendeur 4 sur 5 étoiles Evaluation 4 étoiles, En savoir plus sur les évaluations des vendeurs

Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The most comprehensive and latest&nbspcore reference&nbspin this field Makes it a must for all the analytical laboratories and individual analysts because of its user orientation The most comprehensive and latest core reference in thi. N° de réf. du vendeur 449136963

Contacter le vendeur

Acheter neuf

EUR 619,04
Autre devise
Frais de port : EUR 48,99
De Allemagne vers Etats-Unis
Destinations, frais et délais

Quantité disponible : Plus de 20 disponibles

Ajouter au panier

Image d'archives

Edité par Springer, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Neuf Couverture souple

Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni

Évaluation du vendeur 5 sur 5 étoiles Evaluation 5 étoiles, En savoir plus sur les évaluations des vendeurs

Etat : New. In. N° de réf. du vendeur ria9783662496015_new

Contacter le vendeur

Acheter neuf

EUR 682,97
Autre devise
Frais de port : EUR 13,79
De Royaume-Uni vers Etats-Unis
Destinations, frais et délais

Quantité disponible : Plus de 20 disponibles

Ajouter au panier

Image d'archives

Burkhard Beckhoff
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Neuf Paperback

Vendeur : Grand Eagle Retail, Bensenville, IL, Etats-Unis

Évaluation du vendeur 5 sur 5 étoiles Evaluation 5 étoiles, En savoir plus sur les évaluations des vendeurs

Paperback. Etat : new. Paperback. X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N° de réf. du vendeur 9783662496015

Contacter le vendeur

Acheter neuf

EUR 707,63
Autre devise
Frais de port : Gratuit
Vers Etats-Unis
Destinations, frais et délais

Quantité disponible : 1 disponible(s)

Ajouter au panier

Image fournie par le vendeur

Burkhard Beckhoff
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Neuf Taschenbuch
impression à la demande

Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne

Évaluation du vendeur 5 sur 5 étoiles Evaluation 5 étoiles, En savoir plus sur les évaluations des vendeurs

Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students. 904 pp. Englisch. N° de réf. du vendeur 9783662496015

Contacter le vendeur

Acheter neuf

EUR 748,99
Autre devise
Frais de port : EUR 23
De Allemagne vers Etats-Unis
Destinations, frais et délais

Quantité disponible : 2 disponible(s)

Ajouter au panier

Image d'archives

Edité par Springer, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Neuf Couverture souple

Vendeur : California Books, Miami, FL, Etats-Unis

Évaluation du vendeur 5 sur 5 étoiles Evaluation 5 étoiles, En savoir plus sur les évaluations des vendeurs

Etat : New. N° de réf. du vendeur I-9783662496015

Contacter le vendeur

Acheter neuf

EUR 785,46
Autre devise
Frais de port : Gratuit
Vers Etats-Unis
Destinations, frais et délais

Quantité disponible : Plus de 20 disponibles

Ajouter au panier

Image fournie par le vendeur

Burkhard Beckhoff
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Neuf Taschenbuch

Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne

Évaluation du vendeur 5 sur 5 étoiles Evaluation 5 étoiles, En savoir plus sur les évaluations des vendeurs

Taschenbuch. Etat : Neu. Neuware -X-Ray uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 904 pp. Englisch. N° de réf. du vendeur 9783662496015

Contacter le vendeur

Acheter neuf

EUR 748,99
Autre devise
Frais de port : EUR 60
De Allemagne vers Etats-Unis
Destinations, frais et délais

Quantité disponible : 2 disponible(s)

Ajouter au panier

Image fournie par le vendeur

Burkhard Beckhoff
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Neuf Taschenbuch

Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne

Évaluation du vendeur 5 sur 5 étoiles Evaluation 5 étoiles, En savoir plus sur les évaluations des vendeurs

Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students. N° de réf. du vendeur 9783662496015

Contacter le vendeur

Acheter neuf

EUR 748,99
Autre devise
Frais de port : EUR 66,70
De Allemagne vers Etats-Unis
Destinations, frais et délais

Quantité disponible : 1 disponible(s)

Ajouter au panier

Image d'archives

Beckhoff, Burkhard (Editor)/ Kanngieser, Birgit (Editor)/ Langhoff, Norbert (Editor)/ Wedell, Reiner (Editor)/ Wolff, Helmut (Editor)
Edité par Springer Verlag, 2006
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Neuf Paperback

Vendeur : Revaluation Books, Exeter, Royaume-Uni

Évaluation du vendeur 5 sur 5 étoiles Evaluation 5 étoiles, En savoir plus sur les évaluations des vendeurs

Paperback. Etat : Brand New. 2006 edition. 878 pages. 9.25x6.10x2.01 inches. In Stock. N° de réf. du vendeur x-3662496011

Contacter le vendeur

Acheter neuf

EUR 1 028,82
Autre devise
Frais de port : EUR 17,27
De Royaume-Uni vers Etats-Unis
Destinations, frais et délais

Quantité disponible : 2 disponible(s)

Ajouter au panier

Image d'archives

Burkhard Beckhoff
ISBN 10 : 3662496011 ISBN 13 : 9783662496015
Neuf Paperback

Vendeur : AussieBookSeller, Truganina, VIC, Australie

Évaluation du vendeur 5 sur 5 étoiles Evaluation 5 étoiles, En savoir plus sur les évaluations des vendeurs

Paperback. Etat : new. Paperback. X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally,selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each sectionis largely self-contained. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. N° de réf. du vendeur 9783662496015

Contacter le vendeur

Acheter neuf

EUR 1 190,91
Autre devise
Frais de port : EUR 31,77
De Australie vers Etats-Unis
Destinations, frais et délais

Quantité disponible : 1 disponible(s)

Ajouter au panier