Strain-induced Effects in Advanced MOSFETs - Couverture rigide

Livre 3 sur 17: Computational Microelectronics

Sverdlov, Viktor

 
9783709103814: Strain-induced Effects in Advanced MOSFETs

Synopsis

Strain is used to boost performance of MOSFETs. Modeling of strain effects on transport is an important task of modern simulation tools required for device design. The book covers all relevant modeling approaches used to describe strain in silicon. The subband structure in stressed semiconductor films is investigated in devices using analytical k.p and numerical pseudopotential methods. A rigorous overview of transport modeling in strained devices is given.

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Présentation de l'éditeur

Strain is used to boost performance of MOSFETs. Modeling of strain effects on transport is an important task of modern simulation tools required for device design. The book covers all relevant modeling approaches used to describe strain in silicon. The subband structure in stressed semiconductor films is investigated in devices using analytical k.p and numerical pseudopotential methods. A rigorous overview of transport modeling in strained devices is given.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Autres éditions populaires du même titre

9783709119334: Strain-Induced Effects in Advanced MOSFETs

Edition présentée

ISBN 10 :  3709119332 ISBN 13 :  9783709119334
Editeur : Springer, 2016
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