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Aging Degradation and Countermeasures: in Deep-submicrometer Analog and Mixed Signal Integrated Circuits - Couverture souple
Synopsis
This book summarizes the outcome of investigations on the effects of aging mechanisms induced parameter shifts and performance degradation in analog and mixed signal integrated circuits. Degradation induced due to aging mechanisms like bias temperature instability, conducting and non-conducting hot carrier injection in NMOS and PMOS devices leads to increased challenges in design of reliable circuits in deep-submicrometer CMOS technologies. The lifetime degradation induces threshold voltage and drain current shifts that can result into mismatch in matched transistor pairs which is especially important for analog and mixed signal circuit's accuracy. The investigations are done based on analytical evaluation, aging simulation and measurements using sample circuits implemented in state-of-the-art 32nm high-k metal gate CMOS technology. Calibration and correction techniques suitable for overcoming time varying aging induced circuit performance degradation are proposed and investigated. This book is structured to guide the reader from important aging mechanisms, over to aging degradation in analog and mixed signal building blocks and countermeasures to overcome these effects.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
À propos de l'auteur
Shailesh More obtained the Dr.-Ing. degree in 2012, while working as a research engineer at Institute of Technical Electronics of Technische Universität München. He obtained MSc. degree in IC design under a joint program between TUM, Germany and NTU, Singapore in 2009. He has worked in Wirpo, TI and Infineon Technologies in the field of IC design.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
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Aging Degradation and Countermeasures
ISBN 10 : 3838134702
ISBN 13 : 9783838134703
Neuf
Taschenbuch
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book summarizes the outcome of investigations on the effects of aging mechanisms induced parameter shifts and performance degradation in analog and mixed signal integrated circuits. Degradation induced due to aging mechanisms like bias temperature instability, conducting and non-conducting hot carrier injection in NMOS and PMOS devices leads to increased challenges in design of reliable circuits in deep-submicrometer CMOS technologies. The lifetime degradation induces threshold voltage and drain current shifts that can result into mismatch in matched transistor pairs which is especially important for analog and mixed signal circuit's accuracy. The investigations are done based on analytical evaluation, aging simulation and measurements using sample circuits implemented in state-of-the-art 32nm high-k metal gate CMOS technology. Calibration and correction techniques suitable for overcoming time varying aging induced circuit performance degradation are proposed and investigated. This book is structured to guide the reader from important aging mechanisms, over to aging degradation in analog and mixed signal building blocks and countermeasures to overcome these effects. 140 pp. Englisch. N° de réf. du vendeur 9783838134703
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Aging Degradation and Countermeasures : in Deep-submicrometer Analog and Mixed Signal Integrated Circuits
Edité par
Südwestdeutscher Verlag Für Hochschulschriften, 2012
ISBN 10 : 3838134702
ISBN 13 : 9783838134703
Neuf
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Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
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Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book summarizes the outcome of investigations on the effects of aging mechanisms induced parameter shifts and performance degradation in analog and mixed signal integrated circuits. Degradation induced due to aging mechanisms like bias temperature instability, conducting and non-conducting hot carrier injection in NMOS and PMOS devices leads to increased challenges in design of reliable circuits in deep-submicrometer CMOS technologies. The lifetime degradation induces threshold voltage and drain current shifts that can result into mismatch in matched transistor pairs which is especially important for analog and mixed signal circuit's accuracy. The investigations are done based on analytical evaluation, aging simulation and measurements using sample circuits implemented in state-of-the-art 32nm high-k metal gate CMOS technology. Calibration and correction techniques suitable for overcoming time varying aging induced circuit performance degradation are proposed and investigated. This book is structured to guide the reader from important aging mechanisms, over to aging degradation in analog and mixed signal building blocks and countermeasures to overcome these effects. N° de réf. du vendeur 9783838134703
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Aging Degradation and Countermeasures
Edité par
Südwestdeutscher Verlag für Hochschulschriften, 2012
ISBN 10 : 3838134702
ISBN 13 : 9783838134703
Neuf
Couverture souple
Vendeur : moluna, Greven, Allemagne
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: More ShaileshShailesh More obtained the Dr.-Ing. degree in 2012, while working as a research engineer at Institute of Technical Electronics of Technische Universitaet Muenchen. He obtained MSc. degree in IC design under a joint program. N° de réf. du vendeur 5407745
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Aging Degradation and Countermeasures | in Deep-submicrometer Analog and Mixed Signal Integrated Circuits
Edité par
Südwestdeutscher Verlag für Hochschulschriften, 2015
ISBN 10 : 3838134702
ISBN 13 : 9783838134703
Neuf
Taschenbuch
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Taschenbuch. Etat : Neu. Aging Degradation and Countermeasures | in Deep-submicrometer Analog and Mixed Signal Integrated Circuits | Shailesh More | Taschenbuch | 140 S. | Englisch | 2015 | Südwestdeutscher Verlag für Hochschulschriften | EAN 9783838134703 | Verantwortliche Person für die EU: BoD - Books on Demand, In de Tarpen 42, 22848 Norderstedt, info[at]bod[dot]de | Anbieter: preigu. N° de réf. du vendeur 106238064
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Aging Degradation and Countermeasures
Edité par
Südwestdeutscher Verlag Für Hochschulschriften Sep 2012, 2012
ISBN 10 : 3838134702
ISBN 13 : 9783838134703
Neuf
Taschenbuch
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book summarizes the outcome of investigations on the effects of aging mechanisms induced parameter shifts and performance degradation in analog and mixed signal integrated circuits. Degradation induced due to aging mechanisms like bias temperature instability, conducting and non-conducting hot carrier injection in NMOS and PMOS devices leads to increased challenges in design of reliable circuits in deep-submicrometer CMOS technologies. The lifetime degradation induces threshold voltage and drain current shifts that can result into mismatch in matched transistor pairs which is especially important for analog and mixed signal circuit's accuracy. The investigations are done based on analytical evaluation, aging simulation and measurements using sample circuits implemented in state-of-the-art 32nm high-k metal gate CMOS technology. Calibration and correction techniques suitable for overcoming time varying aging induced circuit performance degradation are proposed and investigated. This book is structured to guide the reader from important aging mechanisms, over to aging degradation in analog and mixed signal building blocks and countermeasures to overcome these effects.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 140 pp. Englisch. N° de réf. du vendeur 9783838134703
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