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Near-field Characterization of Photonic Nanodevices: Near-field Scanning Optical Microscopy (NSOM) characterization of photonic nanodevices and nanoscale optical phenomena - Couverture souple

Abashin, Maxim

 
9783838307114: Near-field Characterization of Photonic Nanodevices: Near-field Scanning Optical Microscopy (NSOM) characterization of photonic nanodevices and nanoscale optical phenomena
Couverture souple
ISBN 10 : 3838307119 ISBN 13 : 9783838307114
Editeur : LAP Lambert Academic Publishing, 2009

Synopsis

The increasing density of data transmission, speed of all-optical signal processing, and demand for higher resolution microscopy and spectroscopy stimulate the development of the nanophotonics. Near- field microscopy is not limited by light diffraction and thus it can achieve sufficiently subwavelength resolution. Therefore this approach is perfect for nanophotonic device characterization. Heterodyne detection allows resolution of the optical phase and improves signal-to-noise performance in near-field microscopy. The book describes a Heterodyne Near- field Scanning Optical Microscope (HNSOM) and applications of this approach to characterization of several classes of the photonic nanodevices.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

The increasing density of data transmission, speed of all-optical signal processing, and demand for higher resolution microscopy and spectroscopy stimulate the development of the nanophotonics. Near- field microscopy is not limited by light diffraction and thus it can achieve sufficiently subwavelength resolution. Therefore this approach is perfect for nanophotonic device characterization. Heterodyne detection allows resolution of the optical phase and improves signal-to-noise performance in near-field microscopy. The book describes a Heterodyne Near- field Scanning Optical Microscope (HNSOM) and applications of this approach to characterization of several classes of the photonic nanodevices.

Biographie de l'auteur

Maxim Abashin received a B.S. and M.S. degrees from Moscow Institute of Physics and Technology (Russia), and Ph.D. degree in Photonics from the University of California, San Diego. His graduate research on near-field scanning optical microscopy (NSOM) and characterization of nanophotonic devices was supervised by Prof. Yeshaiahu Fainman.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP Lambert Academic Publishing
Date d'édition
2009
Langue
anglais
ISBN 10 
3838307119
ISBN 13 
9783838307114
Reliure
Broché
Nombre de pages
100
Coordonnées du fabricant
non disponible
Personne responsable
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