Microstructure characterization of some polycrystalline materials: Preparation and microstructure characterization of some industrial polycrystalline materials by Rietveld method - Couverture souple

Dutta, Dr. Hema; Dr. S.K. Pradhan, Prof.

 
9783838397764: Microstructure characterization of some polycrystalline materials: Preparation and microstructure characterization of some industrial polycrystalline materials by Rietveld method
Couverture souple
ISBN 10 : 3838397762 ISBN 13 : 9783838397764
Editeur : LAP LAMBERT Academic Publishing, 2010

Synopsis

In this book the results of preparation and microstructure characterization of some of the polycrystalline industrial materials are reported. It is well established that "tailor made" materials with desired properties can be obtained by controlling the defect related microstructure parameters. The microstructure of a material can be characterized from an analysis of X-ray diffraction line profile that provides a nondestructive indirect method for obtaining large number of microstructure parameters. Polycrystalline materials have been prepared by vacuum melting and high energy ball milling methods. Microstructure characterization of the prepared materials has been made using X-ray powder diffraction, high- resolution optical microscopy and transmission electron microscopy etc. Mechanical property of some of the metallic alloys in terms of microhardness has been measured and structure property correlation has been established for these materials. Special emphasis has been given to the modified Warren-Averbach's approach of Fourier analysis and Rietveld's method of whole powder diffraction profile fitting analysis.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

In this book the results of preparation and microstructure characterization of some of the polycrystalline industrial materials are reported. It is well established that "tailor made" materials with desired properties can be obtained by controlling the defect related microstructure parameters. The microstructure of a material can be characterized from an analysis of X-ray diffraction line profile that provides a nondestructive indirect method for obtaining large number of microstructure parameters. Polycrystalline materials have been prepared by vacuum melting and high energy ball milling methods. Microstructure characterization of the prepared materials has been made using X-ray powder diffraction, high- resolution optical microscopy and transmission electron microscopy etc. Mechanical property of some of the metallic alloys in terms of microhardness has been measured and structure property correlation has been established for these materials. Special emphasis has been given to the modified Warren-Averbach's approach of Fourier analysis and Rietveld's method of whole powder diffraction profile fitting analysis.

Biographie de l'auteur

Dr. Hema Dutta is presently working as Assistant Professor in Physics. She worked on preparation and microstructure characterization of nanocrystalline material and obtained Ph.D degree from The University of Burdwan. She also worked as post-doctoral researcher at NCKU, Taiwan for more than one year.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2010
Langue
anglais
ISBN 10 
3838397762
ISBN 13 
9783838397764
Reliure
Broché
Nombre de pages
260
Coordonnées du fabricant
non disponible
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