Electron and X-ray Microanalysis of Planetary Materials: From Comet 81P/Wild2 to the Surface of Mars - Couverture souple

Changela, Hitesh

 
9783845403229: Electron and X-ray Microanalysis of Planetary Materials: From Comet 81P/Wild2 to the Surface of Mars
Couverture souple
ISBN 10 : 3845403225 ISBN 13 : 9783845403229
Editeur : LAP LAMBERT Academic Publishing, 2011

Synopsis

This thesis purports the electron and X-ray microanalysis of planetary materials: from Comet 81P/Wild2 to the surface of Mars. Advanced techniques in electron microscopy and X-ray spectroscopy have been developed for the microanalysis of the nakhlite martian meteorites and Comet 81P/Wild2 samples from the Stardust Mission. Electron microprobe analysis and a Focussed Ion Beam - Scanning Electron Microscope (FIB-SEM) technique for Transmission Electron Microscopy (TEM) was used to analyse the secondary mineral assemblages in the nakhlite martian meteorites. Using these techniques, a model is proposed describing the formation of the nakhlites’ secondary assemblages by an impact-induced hydrothermal system based on the mineralogical and geochemical differences between different samples. A suite of Stardust cometary samples have also been analysed using FIB-TEM and microfocus X-ray spectroscopy that includes: X-ray Fluorescence Spectroscopy (XRF), X-ray Absorption Near-Edge Structure (XANES) and Extended X-ray Absorption Fine Structure (EXAFS) at the Diamond synchrotron, the understand the composition of Comet 81P/Wild2 and Jupiter Family Comets.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2011
Langue
anglais
ISBN 10 
3845403225
ISBN 13 
9783845403229
Reliure
Broché
Nombre de pages
264
Coordonnées du fabricant
non disponible
Personne responsable
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