Advanced Materials: Cubic Boron Nitride: XRD, Electron Microscopy and EELS characterization - Couverture souple

Jayawardane, Dammika N.

 
9783846530122: Advanced Materials: Cubic Boron Nitride: XRD, Electron Microscopy and EELS characterization
Couverture souple
ISBN 10 : 3846530123 ISBN 13 : 9783846530122
Editeur : LAP LAMBERT Academic Publishing, 2012

Synopsis

In the world of advanced materials, cubic boron nitride is an active competitor for diamond, with similar properties. To develop advanced materials, it is essential to have characterization techniques, which reveal the structure and chemistry of the samples. Especially in the era of nanotechnology, techniques capable of high spatial resolution are required. This monograph addresses characterization of abrasive cubic boron nitride (ABN) particles by X-ray diffraction (XRD), electron microscopy (EM) and electron energy loss spectroscopy (EELS) in the STEM. XRD profiles of ABN samples are correlated with particle morphology and compositional variations. EELS in STEM is utilized to gain nanostructural information as well as electronic structure. Results are given showing anomalous surface structure-a layer of h-BN as well as oxidation, stoichiometry, and inclusions inside the particles. ELNES is revealed for c-BN, h-BN, and BC2N and are compared with ab-initio theory and with previously recorded results. The book should be especially useful for those researchers developing new materials as well as for those concerned with modern characterization techniques in materials science and EM.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

In the world of advanced materials, cubic boron nitride is an active competitor for diamond, with similar properties. To develop advanced materials, it is essential to have characterization techniques, which reveal the structure and chemistry of the samples. Especially in the era of nanotechnology, techniques capable of high spatial resolution are required. This monograph addresses characterization of abrasive cubic boron nitride (ABN) particles by X-ray diffraction (XRD), electron microscopy (EM) and electron energy loss spectroscopy (EELS) in the STEM. XRD profiles of ABN samples are correlated with particle morphology and compositional variations. EELS in STEM is utilized to gain nanostructural information as well as electronic structure. Results are given showing anomalous surface structure-a layer of h-BN as well as oxidation, stoichiometry, and inclusions inside the particles. ELNES is revealed for c-BN, h-BN, and BC2N and are compared with ab-initio theory and with previously recorded results. The book should be especially useful for those researchers developing new materials as well as for those concerned with modern characterization techniques in materials science and EM.

Biographie de l'auteur

Dr. D. N. Jayawardane obtained her B. Sc. degree in Physics (Sp.) from the Univ. of Sri Jayewardenepura, Sri Lanka. Her postgraduate research was carried out in the Microstructural Physics group in the Cavendish Laboratory, Univ. of Cambridge, UK, where she was awarded the Ph.D. She is a senior lecturer in the Dept. of Physics at USJ, Sri Lanka.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2012
Langue
anglais
ISBN 10 
3846530123
ISBN 13 
9783846530122
Reliure
Broché
Nombre de pages
184
Coordonnées du fabricant
non disponible
Personne responsable
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