Investigations at Metal/Si Surfaces and Interfaces: Study of Structural, Morphological, Magnetic and Electrical Behaviour - Couverture souple

Agarwal, Shivani; Jain, I.P.

 
9783847339328: Investigations at Metal/Si Surfaces and Interfaces: Study of Structural, Morphological, Magnetic and Electrical Behaviour
Couverture souple
ISBN 10 : 384733932X ISBN 13 : 9783847339328
Editeur : LAP LAMBERT Academic Publishing, 2012

Synopsis

The interaction of semiconductor surfaces with deposited metals is very important for understanding many aspects of the behavior of microelectronic devices. The early stages of metal-semiconductor interface formation are amenable to analysis with surface sensitive techniques. The most important characteristic of metal semiconductor interface is nature of the potential barrier between the Fermi level in the metal and the majority carrier band edge of semiconductor of that interface. The study of metal / semiconductor (Si) reactions are of great importance present in every semiconductor device.The present book is an outcome of investigations of structural, morphological, magnetic and electrical behaviour of metal (Co, Cr, Ni) / semiconductor (Si) system.

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Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2012
Langue
anglais
ISBN 10 
384733932X
ISBN 13 
9783847339328
Reliure
Broché
Nombre de pages
136
Coordonnées du fabricant
non disponible
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