Gettering And Defect Engineering In Semiconductor Technology XII: Gadest 2007 : Proceedings of the 12th International Autumn Meeting Emfcsc, Erice, Italy October 14-19, 2007 - Couverture souple

 
9783908451433: Gettering And Defect Engineering In Semiconductor Technology XII: Gadest 2007 : Proceedings of the 12th International Autumn Meeting Emfcsc, Erice, Italy October 14-19, 2007
Couverture souple
ISBN 10 : 3908451434 ISBN 13 : 9783908451433
Editeur : Trans Tech Publications Ltd, 2008

Synopsis

Volume is indexed by Thomson Reuters CPCI-S (WoS).
This collection comprises 117 peerreviewed papers invited from over 70 research institutions in more than 25 countries. These papers, written by internationally recognized experts in the field, review the current state-of-the-art and predict future trends in their respective authors’ fields of research. Fundamental aspects, as well as technological problems associated with defects in electronic materials and devices, are addressed

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Éditeur
Trans Tech Publications Ltd
Date d'édition
2008
Langue
anglais
ISBN 10 
3908451434
ISBN 13 
9783908451433
Reliure
Broché
Nombre de pages
648
Éditeur
Cavallini Anna, Richter Hans, Kittler Martin, Pizzini Sergio
Coordonnées du fabricant
non disponible
Personne responsable
non disponible