Synopsis
Is the first book to focus on the new roles VLSI is taking for the safe, secure, and dependable design and operation of electronic systems
Contributes to a better understanding of threats against safe and secure systems and how to mitigate them by advanced design and testing of VLSI as core components
Describes specific applications of design and testing for dependability in real-world applications such as controls for robots and vehicles, wireless communications, system of systems, and the Internet of Things (IoT)
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VLSI Design and Test for Systems Dependability (eng)
impression à la demandeVendeur : Brook Bookstore On Demand, Napoli, NA, Italie
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Etat : new. Questo è un articolo print on demand. N° de réf. du vendeur 57abdcef20935ea3299d8bc665c4fca7
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VLSI Design and Test for Systems Dependability
Edité par
Springer Japan, 2019
ISBN 10 : 4431568638
ISBN 13 : 9784431568636
Ancien ou d'occasion
Couverture souple
Vendeur : Buchpark, Trebbin, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Etat : Hervorragend. Zustand: Hervorragend | Seiten: 820 | Sprache: Englisch | Produktart: Bücher | This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project ¿Dependable VLSI Systems,¿ in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial¿economic perspectives will also benefit from the discussions in this book. N° de réf. du vendeur 33642900/1
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EUR 131
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VLSI Design and Test for Systems Dependability
Edité par
Springer Japan, 2019
ISBN 10 : 4431568638
ISBN 13 : 9784431568636
Ancien ou d'occasion
Couverture souple
Vendeur : Buchpark, Trebbin, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Etat : Hervorragend. Zustand: Hervorragend | Seiten: 820 | Sprache: Englisch | Produktart: Bücher | This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project ¿Dependable VLSI Systems,¿ in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial¿economic perspectives will also benefit from the discussions in this book. N° de réf. du vendeur 33642900/1001
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EUR 131
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VLSI Design and Test for Systems Dependability
impression à la demandeVendeur : moluna, Greven, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.The book consists of three parts. Part I, as a gener. N° de réf. du vendeur 273276128
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VLSI Design and Test for Systems Dependability
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
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Etat : New. In. N° de réf. du vendeur ria9784431568636_new
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VLSI Design and Test for Systems Dependability
Edité par
Springer Japan Jan 2019, 2019
ISBN 10 : 4431568638
ISBN 13 : 9784431568636
Neuf
Taschenbuch
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project 'Dependable VLSI Systems,' in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial-economic perspectives will also benefit from the discussions in this book. 820 pp. Englisch. N° de réf. du vendeur 9784431568636
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VLSI Design and Test for Systems Dependability
Vendeur : preigu, Osnabrück, Allemagne
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Taschenbuch. Etat : Neu. VLSI Design and Test for Systems Dependability | Shojiro Asai | Taschenbuch | xvii | Englisch | 2019 | Springer Japan | EAN 9784431568636 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. N° de réf. du vendeur 115453332
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Vlsi Design And Test For Systems Dependa
Vendeur : Kennys Bookshop and Art Galleries Ltd., Galway, GY, Irlande
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Vlsi Design And Test For Systems Dependability
Vendeur : Books Puddle, New York, NY, Etats-Unis
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VLSI Design and Test for Systems Dependability
Edité par
Springer Japan, Springer Japan Jan 2019, 2019
ISBN 10 : 4431568638
ISBN 13 : 9784431568636
Neuf
Taschenbuch
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project ¿Dependable VLSI Systems,¿ in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications.This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial¿economic perspectives will also benefit from the discussions in this book.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 820 pp. Englisch. N° de réf. du vendeur 9784431568636
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EUR 246,09
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