Synopsis
In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
À propos de l?auteur
Dr. Nobuo Tanaka is a designated professor of Institute of Materials and Systems for Sustainability (IMaSS) of Nagoya University and an adjunct senior researcher of Japan Fine Ceramic Center (JFCC) and Nagoya Industrial Science Research Institute (NISRI). He received a Ph.D. degree from Applied Physics Department of Nagoya University in 1978 and became an assistant professor of the department. He stayed Arizona State University as a visiting scholar to study with the late Prof. J. Cowley from 1983 to 1985. He was appointed a full professor of Applied Physics of Nagoya University in 1999 through an associate professor. In 2001, he moved to Center of Integrated Research for Science and Engineering (CIRSE) of Nagoya University, which was renamed EcoTopia Science Institute (ESI) in 2004 and IMaSS in 2015. He was the director of the institute from 2012 to 2015. He was also the president of Japanese Microscopy Society (JSM) from 2015 to 2017.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
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Electron Nano-imaging (eng)
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Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM
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ELECTRON NANOIMAGING BASICS OF IMAGING AND DIFFRACTION FOR TEM AND STEM 2ED (HB 2024)
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Electron Nano-imaging
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Buch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details. This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. The comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by various kinds of knowledge around electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today's graduate students and professionals just starting their careers. 416 pp. Englisch. N° de réf. du vendeur 9784431569398
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Electron Nano-Imaging
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microsco. N° de réf. du vendeur 1374129036
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Electron Nano-imaging: Basics of Imaging and Diffraction for TEM and STEM
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Electron Nano-imaging
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ISBN 13 : 9784431569398
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Buch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details. This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. The comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by various kinds of knowledge around electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today¿s graduate students and professionals just starting their careers.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 416 pp. Englisch. N° de réf. du vendeur 9784431569398
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