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Semiconductor Device Failure/Fault Analysis Technology (Reliability Technology Series) (Japanese Language Book)
ISBN 10 : 4817196858
ISBN 13 : 9784817196859
Neuf
Vendeur : Hakone Books, Fujisawa, KANAG, Japon
Évaluation du vendeur 5 sur 5 étoiles
Etat : New. This essential volume, part of the Reliability Technology Series, delves into the critical methodologies and techniques for analyzing defects and failures in semiconductor devices. Published by Nikka Giren Publishing, it offers in-depth insights for professionals and researchers in electronics, manufacturing, and quality control seeking to enhance device reliability and performance. The book covers various analytical approaches, providing a comprehensive resource for understanding and resolving common and complex issues in semiconductor technology. Note: The text is entirely in Japanese. Brand New Japanese Edition. Ships worldwide from Japan via Japan Post. Expedited shipping via FedEx available. N° de réf. du vendeur AB-9784817196859
Acheter neuf
EUR 82,23
Expédition à EUR 8,89
Expédition depuis Japon vers Etats-Unis
Expédition depuis Japon vers Etats-Unis
Quantité disponible : 3 disponible(s)