Atomic force microscopy (AFM) can be used for atomic and nanoscale surface characterization in both air and liquid environments. AFM is basically used to measure the mechanical, chemical and biological properties of the sample under investigation. AFM contains basically a base-excited microcantilever with nano tip along with a sensing circuit for scanning of images. Design and analysis of this microcantilevers is a challenging task in real time practice. In the present work, design and dynamic analysis of rectangular microcantilevers in tapping mode with tip-mass effect is considered. Computer simulations are performed with both lumped-parameter and distributed parameter models. The interatomic forces between the nano tip mass and substrate surfaces are treated using Lennard Jones (LJ) model and DMT model. The equations of motion are derived for both one-degree of freedom lumped parameter model with squeeze-film damping and distributed parameter model under the harmonic base excitation. Also the nonlinearity of the cantilever is investigated by considering cubic stiffness. The distributed parameter model is simplified with one mode approximation using Galerkin’s scheme.
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Atomic force microscopy (AFM) can be used for atomic and nanoscale surface characterization in both air and liquid environments. AFM is basically used to measure the mechanical, chemical and biological properties of the sample under investigation. AFM contains basically a base-excited microcantilever with nano tip along with a sensing circuit for scanning of images. Design and analysis of this microcantilevers is a challenging task in real time practice. In the present work, design and dynamic analysis of rectangular microcantilevers in tapping mode with tip-mass effect is considered. Computer simulations are performed with both lumped-parameter and distributed parameter models. The interatomic forces between the nano tip mass and substrate surfaces are treated using Lennard Jones (LJ) model and DMT model. The equations of motion are derived for both one-degree of freedom lumped parameter model with squeeze-film damping and distributed parameter model under the harmonic base excitation. Also the nonlinearity of the cantilever is investigated by considering cubic stiffness. The distributed parameter model is simplified with one mode approximation using Galerkin's scheme. 68 pp. Englisch. N° de réf. du vendeur 9786134948418
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Vendeur : Revaluation Books, Exeter, Royaume-Uni
Paperback. Etat : Brand New. 68 pages. 8.66x5.91x0.16 inches. In Stock. N° de réf. du vendeur zk6134948411
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Vendeur : moluna, Greven, Allemagne
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Salgar ManojkumarS. Manojkumar completed his Bachelor of Engineering degree from Shivaji University in 2010. He completed Master s of Technology in National Institute of Technology, Rourkela, Odhisa. Currently he is working as Asst. . N° de réf. du vendeur 385843925
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Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Atomic force microscopy (AFM) can be used for atomic and nanoscale surface characterization in both air and liquid environments. AFM is basically used to measure the mechanical, chemical and biological properties of the sample under investigation. AFM contains basically a base-excited microcantilever with nano tip along with a sensing circuit for scanning of images. Design and analysis of this microcantilevers is a challenging task in real time practice. In the present work, design and dynamic analysis of rectangular microcantilevers in tapping mode with tip-mass effect is considered. Computer simulations are performed with both lumped-parameter and distributed parameter models. The interatomic forces between the nano tip mass and substrate surfaces are treated using Lennard Jones (LJ) model and DMT model. The equations of motion are derived for both one-degree of freedom lumped parameter model with squeeze-film damping and distributed parameter model under the harmonic base excitation. Also the nonlinearity of the cantilever is investigated by considering cubic stiffness. The distributed parameter model is simplified with one mode approximation using Galerkin's scheme.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 68 pp. Englisch. N° de réf. du vendeur 9786134948418
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Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Atomic force microscopy (AFM) can be used for atomic and nanoscale surface characterization in both air and liquid environments. AFM is basically used to measure the mechanical, chemical and biological properties of the sample under investigation. AFM contains basically a base-excited microcantilever with nano tip along with a sensing circuit for scanning of images. Design and analysis of this microcantilevers is a challenging task in real time practice. In the present work, design and dynamic analysis of rectangular microcantilevers in tapping mode with tip-mass effect is considered. Computer simulations are performed with both lumped-parameter and distributed parameter models. The interatomic forces between the nano tip mass and substrate surfaces are treated using Lennard Jones (LJ) model and DMT model. The equations of motion are derived for both one-degree of freedom lumped parameter model with squeeze-film damping and distributed parameter model under the harmonic base excitation. Also the nonlinearity of the cantilever is investigated by considering cubic stiffness. The distributed parameter model is simplified with one mode approximation using Galerkin's scheme. N° de réf. du vendeur 9786134948418
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Vendeur : preigu, Osnabrück, Allemagne
Taschenbuch. Etat : Neu. Modeling of AFM Cantilever | A Micro Cantilever Dynamics | Manojkumar Salgar (u. a.) | Taschenbuch | 68 S. | Englisch | 2018 | LAP LAMBERT Academic Publishing | EAN 9786134948418 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. N° de réf. du vendeur 111272761
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