Space Radiation Monitoring Instrumentation - Couverture souple

Mahant, Keyur; Mewada, Hiren; Patel, Amit

 
9786136718255: Space Radiation Monitoring Instrumentation
Couverture souple
ISBN 10 : 6136718251 ISBN 13 : 9786136718255
Editeur : LAP LAMBERT Academic Publishing, 2018

Synopsis

The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing "single event effects". SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

The charged particles can cause adverse effects on spacecraft and electronics components. Radiation effects from high energy particles cause spacecraft surface charging, degradation or permanent failure of the electronic components and sub systems by single event effects, displacement damages and ionizing dose effects in the spacecraft. The effects of ion-induced charge transients can be divided in the basic three categories: Total ionizing dose (TID), linear energy transfer (LET) and Single event upset (SEU).TID effect is accumulation of ionizing energy deposited over a long period on semiconductor materials. TID occurs mostly due to the electrons and protons, which can cause failure of device. The total energy loss or transfer to the material per unit distance of travel trough the material is called LET Electronic devices can be disturbed by the passage of energetic electrons, protons or heavier ions that may alter the state of a circuit, producing "single event effects". SEU and multiple-bit upset (MBU) which change the logic state of internal nodes of the circuit. It can be reset by different electrical operations. These errors are called soft errors which are recoverable.

Biographie de l'auteur

Keyur Mahant was born in Cambay, India on August 2, 1986. He received B.Tech in Electronics and communication from C U Shah College of engineering and technology, India in 2008. He has also received M.Tech in Communication system from CHARUSAT University, India in 2011. Currently, he is pursuing his PhD in the field of RF and Microwave.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2018
Langue
anglais
ISBN 10 
6136718251
ISBN 13 
9786136718255
Reliure
Broché
Nombre de pages
56
Coordonnées du fabricant
non disponible
Personne responsable
non disponible