This book focus on different material characterization tools focusing on morphology/topology and structural properties of the materials. In the chapter related to morphological characterization tools the book mainly discussed Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) whereas structural characterization chapter includes the details of X-ray Diffractometer (XRD), Neutron diffraction, Raman Microscope, Selected Area Electron Diffraction (SAED). Here, we have tried our best to explain each detail of the experimental techniques which will be very helpful to new learners.
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book focus on different material characterization tools focusing on morphology/topology and structural properties of the materials. In the chapter related to morphological characterization tools the book mainly discussed Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) whereas structural characterization chapter includes the details of X-ray Diffractometer (XRD), Neutron diffraction, Raman Microscope, Selected Area Electron Di raction (SAED). Here, we have tried our best to explain each detail of the experimental techniques which will be very helpful to new learners. 60 pp. Englisch. N° de réf. du vendeur 9786200254405
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Vendeur : moluna, Greven, Allemagne
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Solanki Dr. VanarajsinhDr. Vanaraj Solanki had earned his masters in physics (2008) from S. P. University, VVNagar, and Ph.D from Institute of Physics, Bhubaneswar, India. He has also worked at Materials Research Centre, Indian Insti. N° de réf. du vendeur 385886401
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Vendeur : Revaluation Books, Exeter, Royaume-Uni
Paperback. Etat : Brand New. 60 pages. 8.66x5.91x0.14 inches. In Stock. N° de réf. du vendeur zk6200254400
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Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book focus on different material characterization tools focusing on morphology/topology and structural properties of the materials. In the chapter related to morphological characterization tools the book mainly discussed Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) whereas structural characterization chapter includes the details of X-ray Diffractometer (XRD), Neutron diffraction, Raman Microscope, Selected Area Electron Di¿raction (SAED). Here, we have tried our best to explain each detail of the experimental techniques which will be very helpful to new learners.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 60 pp. Englisch. N° de réf. du vendeur 9786200254405
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Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This book focus on different material characterization tools focusing on morphology/topology and structural properties of the materials. In the chapter related to morphological characterization tools the book mainly discussed Transmission Electron Microscope (TEM), Scanning Electron Microscope (SEM), and Atomic Force Microscope (AFM) whereas structural characterization chapter includes the details of X-ray Diffractometer (XRD), Neutron diffraction, Raman Microscope, Selected Area Electron Di raction (SAED). Here, we have tried our best to explain each detail of the experimental techniques which will be very helpful to new learners. N° de réf. du vendeur 9786200254405
Quantité disponible : 1 disponible(s)