As the industry moves to 65 nanometers and below, the challenges related to the design and manufacture of low-power products have increased exponentially. In response to these challenges, the Common Platform technology collaborators and Cadence Design Systems have developed a 65nm low-power reference flow using the Si2 Common Power Format (CPF) standard to provide a single specification of low-power intent throughout the flow. This paper explains how CPF (Common Power Format) methodology can be used to optimize leakage power effectively compared to ad-hoc methods and CPF enabled tools can be used to implement and verify that the low power features works seamlessly throughout the design flow. The paper will illustrate how the specification of design features such as Power Shut Off (PSO), State Retention (SR) Registers and Isolation (ISO) Cells can be inserted & verified and the advantages of using a CPF based flow over an ad-hoc solution.
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -As the industry moves to 65 nanometers and below, the challenges related to the design and manufacture of low-power products have increased exponentially. In response to these challenges, the Common Platform technology collaborators and Cadence Design Systems have developed a 65nm low-power reference flow using the Si2 Common Power Format (CPF) standard to provide a single specification of low-power intent throughout the flow. This paper explains how CPF (Common Power Format) methodology can be used to optimize leakage power effectively compared to ad-hoc methods and CPF enabled tools can be used to implement and verify that the low power features works seamlessly throughout the design flow. The paper will illustrate how the specification of design features such as Power Shut Off (PSO), State Retention (SR) Registers and Isolation (ISO) Cells can be inserted & verified and the advantages of using a CPF based flow over an ad-hoc solution. 56 pp. Englisch. N° de réf. du vendeur 9786202553841
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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: KALKOOR M DR. SHREESHADR.SHREESHA KALKOOR M was born in Udupi city, Karnataka, India in 1981. He received the B.E degree in ECE in 2002 and M.Tech degree in Digital Electronics and Communication in 2010 from Visvesvaraya Technologica. N° de réf. du vendeur 385947189
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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -As the industry moves to 65 nanometers and below, the challenges related to the design and manufacture of low-power products have increased exponentially. In response to these challenges, the Common Platform technology collaborators and Cadence Design Systems have developed a 65nm low-power reference flow using the Si2 Common Power Format (CPF) standard to provide a single specification of low-power intent throughout the flow. This paper explains how CPF (Common Power Format) methodology can be used to optimize leakage power effectively compared to ad-hoc methods and CPF enabled tools can be used to implement and verify that the low power features works seamlessly throughout the design flow. The paper will illustrate how the specification of design features such as Power Shut Off (PSO), State Retention (SR) Registers and Isolation (ISO) Cells can be inserted & verified and the advantages of using a CPF based flow over an ad-hoc solution.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 56 pp. Englisch. N° de réf. du vendeur 9786202553841
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Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - As the industry moves to 65 nanometers and below, the challenges related to the design and manufacture of low-power products have increased exponentially. In response to these challenges, the Common Platform technology collaborators and Cadence Design Systems have developed a 65nm low-power reference flow using the Si2 Common Power Format (CPF) standard to provide a single specification of low-power intent throughout the flow. This paper explains how CPF (Common Power Format) methodology can be used to optimize leakage power effectively compared to ad-hoc methods and CPF enabled tools can be used to implement and verify that the low power features works seamlessly throughout the design flow. The paper will illustrate how the specification of design features such as Power Shut Off (PSO), State Retention (SR) Registers and Isolation (ISO) Cells can be inserted & verified and the advantages of using a CPF based flow over an ad-hoc solution. N° de réf. du vendeur 9786202553841
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Vendeur : preigu, Osnabrück, Allemagne
Taschenbuch. Etat : Neu. OPTIMIZATION OF LEAKAGE POWER USING COMMON POWER FORMAT | Shreesha Kalkoor M | Taschenbuch | 56 S. | Englisch | 2020 | LAP LAMBERT Academic Publishing | EAN 9786202553841 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. N° de réf. du vendeur 118519571
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Vendeur : Mispah books, Redhill, SURRE, Royaume-Uni
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