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Minimization of Dynamic Power Through Structural Changes &Vt Techniques: low power cmos circuits - Couverture souple
Synopsis
Over the past decade, low power, energy efficient Very Large Scale Integration design has been the focal point for active research and development. The rapid technology scaling, growing integration capacity and leakage power dissipation are the contributing factors for increas in the complexity of modern VLSI design. Voltage scaling is one of the most efficient ways for reducing power and energy in VLSI circuitry. Due to the reduced threshold voltage, switching speed becomes faster, active leakage current is increased. A technique to dynamically manage active leakage current, which reduces the energy dissipation in VLSI circuitry at different circuits with different levels of complexity is required. As technology scale into the deep sub micron technology regime, sub threshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore effective leakage and dynamic power minimization techniques become necessary. Ground, power and hybrid gated techniques are proposed as effective circuit level techniques that get better performance, low leakage and low dynamic power. The design and performance evaluation of 1-bi.
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- ÉditeurLAP LAMBERT Academic Publishing
- Date d'édition2020
- ISBN 10 6202672293
- ISBN 13 9786202672290
- ReliureBroché
- Langueanglais
- Nombre de pages236
- Coordonnées du fabricantnon disponible
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Minimization of Dynamic Power Through Structural Changes &Vt Techniques
Edité par
LAP LAMBERT Academic Publishing, 2020
ISBN 10 : 6202672293
ISBN 13 : 9786202672290
Neuf
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Vendeur : moluna, Greven, Allemagne
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Kartoniert / Broschiert. Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Dayadi LakshmaiahAuthor1: Dr. Dayadi.Lakshmaiah professor of electronics and communication engineering, is presently with Sri Indu Institute of Engineering and Technology, Hyderabad, India. He obtained his Doctoral degree from JNTUK. N° de réf. du vendeur 387523380
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Minimization of Dynamic Power Through Structural Changes &Vt Techniques
Edité par
LAP LAMBERT Academic Publishing Jun 2020, 2020
ISBN 10 : 6202672293
ISBN 13 : 9786202672290
Neuf
Taschenbuch
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Over the past decade, low power, energy efficient Very Large Scale Integration design has been the focal point for active research and development. The rapid technology scaling, growing integration capacity and leakage power dissipation are the contributing factors for increas in the complexity of modern VLSI design. Voltage scaling is one of the most efficient ways for reducing power and energy in VLSI circuitry. Due to the reduced threshold voltage, switching speed becomes faster, active leakage current is increased. A technique to dynamically manage active leakage current, which reduces the energy dissipation in VLSI circuitry at different circuits with different levels of complexity is required. As technology scale into the deep sub micron technology regime, sub threshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore effective leakage and dynamic power minimization techniques become necessary. Ground, power and hybrid gated techniques are proposed as effective circuit level techniques that get better performance, low leakage and low dynamic power. The design and performance evaluation of 1-bi. 236 pp. Englisch. N° de réf. du vendeur 9786202672290
Quantité disponible : 2 disponible(s)
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Minimization of Dynamic Power Through Structural Changes &Vt Techniques : low power cmos circuits
Edité par
LAP LAMBERT Academic Publishing, 2020
ISBN 10 : 6202672293
ISBN 13 : 9786202672290
Neuf
Taschenbuch
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Over the past decade, low power, energy efficient Very Large Scale Integration design has been the focal point for active research and development. The rapid technology scaling, growing integration capacity and leakage power dissipation are the contributing factors for increas in the complexity of modern VLSI design. Voltage scaling is one of the most efficient ways for reducing power and energy in VLSI circuitry. Due to the reduced threshold voltage, switching speed becomes faster, active leakage current is increased. A technique to dynamically manage active leakage current, which reduces the energy dissipation in VLSI circuitry at different circuits with different levels of complexity is required. As technology scale into the deep sub micron technology regime, sub threshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore effective leakage and dynamic power minimization techniques become necessary. Ground, power and hybrid gated techniques are proposed as effective circuit level techniques that get better performance, low leakage and low dynamic power. The design and performance evaluation of 1-bi. N° de réf. du vendeur 9786202672290
Quantité disponible : 1 disponible(s)
Image fournie par le vendeur
Minimization of Dynamic Power Through Structural Changes &Vt Techniques
Edité par
LAP LAMBERT Academic Publishing Jun 2020, 2020
ISBN 10 : 6202672293
ISBN 13 : 9786202672290
Neuf
Taschenbuch
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Évaluation du vendeur 5 sur 5 étoiles
Taschenbuch. Etat : Neu. Neuware -Over the past decade, low power, energy efficient Very Large Scale Integration design has been the focal point for active research and development. The rapid technology scaling, growing integration capacity and leakage power dissipation are the contributing factors for increas in the complexity of modern VLSI design. Voltage scaling is one of the most efficient ways for reducing power and energy in VLSI circuitry. Due to the reduced threshold voltage, switching speed becomes faster, active leakage current is increased. A technique to dynamically manage active leakage current, which reduces the energy dissipation in VLSI circuitry at different circuits with different levels of complexity is required. As technology scale into the deep sub micron technology regime, sub threshold leakage power increases exponentially with the reduction of the threshold voltage. Therefore effective leakage and dynamic power minimization techniques become necessary. Ground, power and hybrid gated techniques are proposed as effective circuit level techniques that get better performance, low leakage and low dynamic power. The design and performance evaluation of 1-bi.Books on Demand GmbH, Überseering 33, 22297 Hamburg 236 pp. Englisch. N° de réf. du vendeur 9786202672290
Quantité disponible : 2 disponible(s)