For decades copper sulfide has been considered as the most superior optical and semiconductor material. An attempt has been made to prepare CuS thinfilms by simple chemical bath deposition method. The prepared samples were characterized by XRD, UV and PL to identify and study its structural, optical and electrical properties. Results of XRD analysis confirmed the formation of CuS of Covellite phase. Optical properties were studied and the material exhibits a bandgap ranges 1.6 eV to 1.2 eV. The PL and electrical characterization of the sample has been studied and discussed detail in this book.
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Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -For decades copper sulfide has been considered as the most superior optical and semiconductor material. An attempt has been made to prepare CuS thinfilms by simple chemical bath deposition method. The prepared samples were characterized by XRD, UV and PL to identify and study its structural, optical and electrical properties. Results of XRD analysis confirmed the formation of CuS of Covellite phase. Optical properties were studied and the material exhibits a bandgap ranges 1.6 eV to 1.2 eV. The PL and electrical characterization of the sample has been studied and discussed detail in this book. 100 pp. Englisch. N° de réf. du vendeur 9786204730691
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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -For decades copper sulfide has been considered as the most superior optical and semiconductor material. An attempt has been made to prepare CuS thinfilms by simple chemical bath deposition method. The prepared samples were characterized by XRD, UV and PL to identify and study its structural, optical and electrical properties. Results of XRD analysis confirmed the formation of CuS of Covellite phase. Optical properties were studied and the material exhibits a bandgap ranges 1.6 eV to 1.2 eV. The PL and electrical characterization of the sample has been studied and discussed detail in this book.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 100 pp. Englisch. N° de réf. du vendeur 9786204730691
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Taschenbuch. Etat : Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - For decades copper sulfide has been considered as the most superior optical and semiconductor material. An attempt has been made to prepare CuS thinfilms by simple chemical bath deposition method. The prepared samples were characterized by XRD, UV and PL to identify and study its structural, optical and electrical properties. Results of XRD analysis confirmed the formation of CuS of Covellite phase. Optical properties were studied and the material exhibits a bandgap ranges 1.6 eV to 1.2 eV. The PL and electrical characterization of the sample has been studied and discussed detail in this book. N° de réf. du vendeur 9786204730691
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Taschenbuch. Etat : Neu. Optical and Electrical Properties of Thickness Dependent CuS | A. Sahana Fathima (u. a.) | Taschenbuch | Englisch | 2021 | LAP LAMBERT Academic Publishing | EAN 9786204730691 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu. N° de réf. du vendeur 120999849
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