Exponential Fatigue Life Model for Single-Edge-Notched Beams: An Analytical Approach to Structural Integrity and Fracture Behaviour - Couverture souple

Baliarsingh, Avaya Kumar; Rath, Debabrata

 
9786209272837: Exponential Fatigue Life Model for Single-Edge-Notched Beams: An Analytical Approach to Structural Integrity and Fracture Behaviour
Couverture souple
ISBN 10 : 6209272835 ISBN 13 : 9786209272837
Editeur : LAP LAMBERT Academic Publishing, 2025

Synopsis

This book presents a comprehensive and practical exploration of fatigue crack propagation in single-edge-notched (SEN) beams through the application of an exponential modelling framework. Designed for researchers, engineers, and advanced students, it bridges fundamental fracture mechanics with modern predictive methodologies for evaluating fatigue life. The text offers clear theoretical insights, validated analytical models, and illustrative case studies that demonstrate the accuracy and usefulness of exponential crack growth laws in structural assessment. By combining scientific rigor with accessible explanations, this book equips readers with the knowledge and tools needed to predict fatigue behaviour more reliably, enhance material integrity, and support safer, more efficient engineering designs.

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Éditeur
LAP LAMBERT Academic Publishing
Date d'édition
2025
Langue
anglais
ISBN 10 
6209272835
ISBN 13 
9786209272837
Reliure
Broché
Nombre de pages
80
Coordonnées du fabricant
non disponible
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