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Graphical Introduction - Semiconductor Device Defect and Failure Analysis Technology Lecture Reliability Technology Series Editorial Committee(Chinese Edition)
Edité par
Mechanical Industry Press, 2024
ISBN 10 : 7111749626
ISBN 13 : 9787111749622
Neuf
paperback
Vendeur : liu xing, Nanjing, JS, Chine
Évaluation du vendeur 5 sur 5 étoiles
paperback. Etat : New. Language:Chinese.Paperback. Pub Date: 2024-03 Pages: 168 Publisher: China Machinery Press This book is divided into 4 chapters. including an overview of semiconductor device defects and failure analysis technology. failure analysis technology of silicon integrated circuits (li). defects and failure analysis technology of power devices. and defects and failure analysis technology of compound semiconductor light-emitting devices. The author has opened columns in various places in the book to in. N° de réf. du vendeur DS054453
Acheter neuf
EUR 121,66
Expédition à EUR 16,02
Expédition depuis Chine vers Etats-Unis
Expédition depuis Chine vers Etats-Unis
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