Vendeur : liu xing, Nanjing, JS, Chine
paperback. Etat : New. Language:Chinese.Paperback. Pub Date: 2024-04 Pages: 212 Publisher: People's Posts and Telecommunications Press The emergence of field emission scanning electron microscopes marks the entry of scanning electron microscopes into a new era. Scanning electron microscope technology has made great progress. The application of new technologies such as new electrons. immersion objectives. through-mirror secondary electron detectors. simulated backscatter. e×b and electron beam deceleration h. N° de réf. du vendeur DS061333
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