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Integrated Circuit Design and Integrated Systems -- Digital Integrated Circuit Testing and Design for Testability(Chinese Edition) - Couverture souple
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Language:Chinese.paperback.Pub Date:2024-11.publisher:Chemical Industry Press.description:Paperback. Pub Date: 2024-11 Pages: 190 Publisher: Chemical Industry Press This book starts with the basic concepts of digital integrated circuit testing and design for testability. systematically introducing the concepts. principles. and methods of
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Integrated Circuit Design and Integrated Systems -- Digital Integrated Circuit Testing and Design for Testability(Chinese Edition)
Vendeur : liu xing, Nanjing, JS, Chine
Évaluation du vendeur 5 sur 5 étoiles
paperback. Etat : New. Language:Chinese.Paperback. Pub Date: 2024-11 Pages: 190 Publisher: Chemical Industry Press This book starts with the basic concepts of digital integrated circuit testing and design for testability. systematically introducing the concepts. principles. and methods of digital integrated circuit testing. Main contents include: fundamentals of digital integrated circuit testing. test vector generation. design for testability and scan testing. boundary scan testing. built-in self-test. memory test. N° de réf. du vendeur DT050125
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EUR 101,35
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Expédition depuis Chine vers Etats-Unis
Expédition depuis Chine vers Etats-Unis
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