Development History of IEC and IEEE High Voltage and High Current Test Standards(Chinese Edition) - Couverture souple

GUO JI DA DIAN WANG WEI YUAN HUI D1.35 GONG ZUO ZU , FAN JIAN BIN , LI PENG , YIN YU DENG YI

 
9787519836641: Development History of IEC and IEEE High Voltage and High Current Test Standards(Chinese Edition)

Synopsis

Language:Chinese.paperback.Pub Date:2019-09.publisher:China Electric Power Press.description:Paperback.Pub Date:2019-09 Pages:64 Language:Chinese Publisher:China Electric Power Press The authors have tried to clarify the difficulties in interpreting some standard clauses in the Development History of IECIEEE High Voltage and High Current Te

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