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Scanning electron microscopy and electron probe of basic and applied (refined)(Chinese Edition) - Couverture souple
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Foundation and application of scanning electron microscopy and electron probe(Chinese Edition)
Edité par
Shanghai Science and Technology Pub. Date :2009-12-01 version 1, 2000
ISBN 10 : 7532399915
ISBN 13 : 9787532399918
Neuf
Couverture rigide
Vendeur : liu xing, Nanjing, JS, Chine
Évaluation du vendeur 5 sur 5 étoiles
Hardcover. Etat : New. HardCover Pub Date: December 2009 Pages: 206 Language: Chinese in Publisher: Shanghai Science and Technology Press. the foundation and application of scanning electron microscopy and electron probe through research instance. introduced a scanning electron microscope and electron probe in materials research. especially in the study of inorganic non-metallic materials. The book is divided into seven chapters. the content involves scanning electron microscopy and electron probe and scanning elec. N° de réf. du vendeur CC012030
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Expédition depuis Chine vers Etats-Unis
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