Rad-hard Analog ICs is a practical guide for researchers and engineers designing and preliminarily characterizing radiation-hardened analog and mixed-signal circuits in standard CMOS technologies across multiple foundries and nodes.
The opening chapter explains the fundamental radiation effects encountered in space and other harsh environments, establishing the scientific basis for radiation hardening by design (RHBD) techniques used to mitigate total ionizing dose (TID), single-event effects (SEE), and transient disturbances.
The core chapters focus on three essential building blocks―band-gap references (BGRs), digital-to-analog converters (DACs), and analog-to-digital converters (ADCs). Each chapter begins with a concise review of circuit operating principles, followed by a survey of leading RHBD strategies from the literature. The authors then present their own rad-hard implementations, detailing the complete design flow from transistor-level mitigation techniques to layout-level hardening strategies.
The final chapter provides a practical overview of radiation testing methodologies for analog and mixed-signal circuits, with emphasis on experimental campaigns conducted by the authors. Measured results under TID and SEE conditions illustrate both characterization techniques and real-world performance.
Topics include:
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Dr. Umberto Gatti was born in Pavia (Italy) in 1962. He received Laurea and Ph.D. degrees in electronics engineering from the University of Pavia in 1987 and 1992, respectively. From 1993 to 1999, he worked in the R&D Lab of Italtel, as ASIC Designer, and was involved in modeling analog ICs. In 1999, he joined the Development Technologies Lab of Siemens, where he was Sr. Design ASIC Engineer. Besides developing telecom ICs, he was the coordinator of Eureka-Medea+ projects focused on high-speed sigma-delta converters. In 2008 he moved to Nokia Siemens Networks where he worked as Sr. Power Supply Architect. Since 2012 he has been with RedCat Devices as a member of the executive staff. During his career he has been involved in the design of data-converters, broadband wireless transceivers, Hall sensors micro-systems and power supply architectures. His current research interests are in rad-hard CMOS ICs, particularly rad-hard libraries and memories (SRAMs and OTP), rad-hard mixed-signal circuits (ADC-DAC), rad-hard linear voltage regulators, and in testing such components. He holds 2 international patents and is co-author of about 60 papers and one book. He is Senior Member of IEEE and serves also as reviewer for magazines and conferences.
Cristiano Calligaro received his laurea degree in electronics engineering and his Ph.D. degree in electronics and information technology engineering from the University of Pavia (Italy) in 1992 and 1997 respectively. In 2006 he established RedCat Devices srl as a start-up. During his career he has been involved in memory design (volatile and non-volatile) both for consumer application (multilevel flash memories) and space applications (rad-hard memories) and software design for SEE/TID evaluation using open source EDA tools. His current research interest is focused on rad-hard standard cell libraries to be used for rad-hard mixed signal ASICs, stand-alone memory compilers and testing methodologies for rad-hard components. He holds more than 20 patents mainly in the field of multilevel NVMs and he is co-author of more than 60 papers and one book (Rad-hard Semiconductor Memories, River Publishers). He has been coordinator of RAMSES and ATENA projects inside the Italy–Israel Cooperation Programme, SkyFlash project in the European FP7 Programme, EuroSRAM4Space project in the Eureka Eurostars Programme and RADPROM project funded by Italian Space Agency (ASI). He is an IEEE Senior Member and an IEEE Transactions on Nuclear Science reviewer.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
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Hardcover. Etat : new. Hardcover. Rad-hard Analog ICs is a practical guide for researchers and engineers designing and preliminarily characterizing radiation-hardened analog and mixed-signal circuits in standard CMOS technologies across multiple foundries and nodes.The opening chapter explains the fundamental radiation effects encountered in space and other harsh environments, establishing the scientific basis for radiation hardening by design (RHBD) techniques used to mitigate total ionizing dose (TID), single-event effects (SEE), and transient disturbances.The core chapters focus on three essential building blocksband-gap references (BGRs), digital-to-analog converters (DACs), and analog-to-digital converters (ADCs). Each chapter begins with a concise review of circuit operating principles, followed by a survey of leading RHBD strategies from the literature. The authors then present their own rad-hard implementations, detailing the complete design flow from transistor-level mitigation techniques to layout-level hardening strategies.The final chapter provides a practical overview of radiation testing methodologies for analog and mixed-signal circuits, with emphasis on experimental campaigns conducted by the authors. Measured results under TID and SEE conditions illustrate both characterization techniques and real-world performance.Topics include:Radiation effects and RHBD methodologiesRad-hard band-gap references (BGRs)Rad-hard digital-to-analog converters (DACs)Rad-hard analog-to-digital converters (ADCs)Radiation testing of analog and mixed-signal ICs This is a practical guide to designing and characterizing radiation-hardened analog and mixed-signal circuits in standard CMOS. Covering BGRs, DACs, ADCs, RHBD techniques, and radiation testing under TID and SEE, it walks readers from device-level mitigation to layout strategies and measured experimental results. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. N° de réf. du vendeur 9788770224192
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Hardcover. Etat : new. Hardcover. Rad-hard Analog ICs is a practical guide for researchers and engineers designing and preliminarily characterizing radiation-hardened analog and mixed-signal circuits in standard CMOS technologies across multiple foundries and nodes.The opening chapter explains the fundamental radiation effects encountered in space and other harsh environments, establishing the scientific basis for radiation hardening by design (RHBD) techniques used to mitigate total ionizing dose (TID), single-event effects (SEE), and transient disturbances.The core chapters focus on three essential building blocksband-gap references (BGRs), digital-to-analog converters (DACs), and analog-to-digital converters (ADCs). Each chapter begins with a concise review of circuit operating principles, followed by a survey of leading RHBD strategies from the literature. The authors then present their own rad-hard implementations, detailing the complete design flow from transistor-level mitigation techniques to layout-level hardening strategies.The final chapter provides a practical overview of radiation testing methodologies for analog and mixed-signal circuits, with emphasis on experimental campaigns conducted by the authors. Measured results under TID and SEE conditions illustrate both characterization techniques and real-world performance.Topics include:Radiation effects and RHBD methodologiesRad-hard band-gap references (BGRs)Rad-hard digital-to-analog converters (DACs)Rad-hard analog-to-digital converters (ADCs)Radiation testing of analog and mixed-signal ICs This is a practical guide to designing and characterizing radiation-hardened analog and mixed-signal circuits in standard CMOS. Covering BGRs, DACs, ADCs, RHBD techniques, and radiation testing under TID and SEE, it walks readers from device-level mitigation to layout strategies and measured experimental results. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. N° de réf. du vendeur 9788770224192
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