Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.
Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.
Model based testing is the most powerful technique for testing hardware and software systems. This book describes the use of models at all the levels of hardware testing. It includes a description of fault models for nanoscaled CMOS technology.
Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.
Vendeur : Lucky's Textbooks, Dallas, TX, Etats-Unis
Etat : New. N° de réf. du vendeur ABLIING23Apr0412070049965
Quantité disponible : Plus de 20 disponibles
Vendeur : BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. 272 pp. Englisch. N° de réf. du vendeur 9789400730939
Quantité disponible : 2 disponible(s)
Vendeur : moluna, Greven, Allemagne
Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Introduction of model based hardware testingDescribes fault models for nanoscaled CMOS technologyFault simulation, ATPG and diagnosis algorithms for complex fault modelsComprehensive treatment including memory and low power aspects. N° de réf. du vendeur 5826155
Quantité disponible : Plus de 20 disponibles
Vendeur : Books Puddle, New York, NY, Etats-Unis
Etat : New. pp. 272. N° de réf. du vendeur 2614418904
Quantité disponible : 4 disponible(s)
Vendeur : Majestic Books, Hounslow, Royaume-Uni
Etat : New. Print on Demand pp. 272 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam. N° de réf. du vendeur 11254791
Quantité disponible : 4 disponible(s)
Vendeur : Biblios, Frankfurt am main, HESSE, Allemagne
Etat : New. PRINT ON DEMAND pp. 272. N° de réf. du vendeur 1814418898
Quantité disponible : 4 disponible(s)
Vendeur : Ria Christie Collections, Uxbridge, Royaume-Uni
Etat : New. In. N° de réf. du vendeur ria9789400730939_new
Quantité disponible : Plus de 20 disponibles
Vendeur : preigu, Osnabrück, Allemagne
Taschenbuch. Etat : Neu. Models in Hardware Testing | Lecture Notes of the Forum in Honor of Christian Landrault | Hans-Joachim Wunderlich | Taschenbuch | xiv | Englisch | 2012 | Springer Netherland | EAN 9789400730939 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand. N° de réf. du vendeur 106602652
Quantité disponible : 5 disponible(s)
Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne
Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 272 pp. Englisch. N° de réf. du vendeur 9789400730939
Quantité disponible : 1 disponible(s)
Vendeur : AHA-BUCH GmbH, Einbeck, Allemagne
Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Model based testing is the most powerful technique for testing hardware and software systems. Models in Hardware Testing describes the use of models at all the levels of hardware testing. The relevant fault models for nanoscaled CMOS technology are introduced, and their implications on fault simulation, automatic test pattern generation, fault diagnosis, memory testing and power aware testing are discussed. Models and the corresponding algorithms are considered with respect to the most recent state of the art, and they are put into a historical context by a concluding chapter on the use of physical fault models in fault tolerance. N° de réf. du vendeur 9789400730939
Quantité disponible : 1 disponible(s)