Design, Analysis and Test of Logic Circuits Under Uncertainty - Couverture souple

Krishnaswamy, Smita; Markov, Igor L.; Hayes, John P.

9789400797987: Design, Analysis and Test of Logic Circuits Under Uncertainty

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ISBN 10 : 9400797982 ISBN 13 : 9789400797987

Editeur : Springer, 2014

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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

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Combining theory with practical examples, this volume presents a comprehensive overview of logic circuits. The text presents techniques used to analyze, design and test logic circuits with probabilistic behavior, and provides a multidisciplinary approach to uncertainty.

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�diteurSpringer
Date d'�dition2014
ISBN 10 9400797982
ISBN 13 9789400797987
ReliureBroch�
Langueanglais
Nombre de pages136
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9789048196432: Design, Analysis and Test of Logic Circuits Under Uncertainty

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Design, Analysis and Test of Logic Circuits Under Uncertainty

Smita Krishnaswamy|Igor L. Markov|John P. Hayes

Edit� par Springer Netherlands, 2014

ISBN 10 : 9400797982 ISBN 13 : 9789400797987

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Etat : New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a comprehensive overview of Logic CircuitsCombines theory with practical examplesMulti-discipline approach to the hot topic of uncertaintyLogic circuits are becoming increasingly susceptible to probabilistic behavior caus. N� de r�f. du vendeur 5828622

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Design, Analysis and Test of Logic Circuits Under Uncertainty

Smita Krishnaswamy

Edit� par Springer Netherlands Okt 2014, 2014

ISBN 10 : 9400797982 ISBN 13 : 9789400797987

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Taschenbuch. Etat : Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. 136 pp. Englisch. N� de r�f. du vendeur 9789400797987

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Design, Analysis and Test of Logic Circuits Under Uncertainty

Smita Krishnaswamy

Edit� par Springer Netherlands, Springer Netherlands, 2014

ISBN 10 : 9400797982 ISBN 13 : 9789400797987

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Taschenbuch. Etat : Neu. Druck auf Anfrage Neuware - Printed after ordering - Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. N� de r�f. du vendeur 9789400797987

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Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, 115)

Krishnaswamy, Smita; Markov, Igor L.; Hayes, John P.

Edit� par Springer, 2014

ISBN 10 : 9400797982 ISBN 13 : 9789400797987

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Design, Analysis and Test of Logic Circuits Under Uncertainty

Smita Krishnaswamy

Edit� par Springer Netherlands, Springer Netherlands Okt 2014, 2014

ISBN 10 : 9400797982 ISBN 13 : 9789400797987

Neuf Taschenbuch

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Vendeur : buchversandmimpf2000, Emtmannsberg, BAYE, Allemagne

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Taschenbuch. Etat : Neu. This item is printed on demand - Print on Demand Titel. Neuware -Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 136 pp. Englisch. N� de r�f. du vendeur 9789400797987

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