X-Ray Spectroscopy - Couverture rigide

Couverture rigide

ISBN 10 : 9533079673 ISBN 13 : 9789533079677

Editeur : IntechOpen, 2012

Synopsis

The x-ray is the only invention that became a regular diagnostic tool in hospitals within a week of its first observation by Roentgen in 1895. Even today, x-rays are a great characterization tool at the hands of scientists working in almost every field, such as medicine, physics, material science, space science, chemistry, archeology, and metallurgy. With vast existing applications of x-rays, it is even more surprising that every day people are finding new applications of x-rays or refining the existing techniques. This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The chapters have been grouped into two major sections based upon the techniques and applications. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.

Détails de l'édition

• Éditeur: IntechOpen
• Date d'édition: 2012
• Langue: anglais
• ISBN 10: 9533079673
• ISBN 13: 9789533079677
• Reliure: Relié
• Nombre de pages: 292
• Éditeur: Sharma Shatendra K K.
• Coordonnées du fabricant: non disponible
• Personne responsable: non disponible