Scanning Probe Microscopy-Physical Property Characterization at Nanoscale - Couverture rigide

 
9789535105763: Scanning Probe Microscopy-Physical Property Characterization at Nanoscale
Couverture rigide
ISBN 10 : 9535105760 ISBN 13 : 9789535105763
Editeur : IntechOpen, 2012

Synopsis

Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.

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Éditeur
IntechOpen
Date d'édition
2012
Langue
anglais
ISBN 10 
9535105760
ISBN 13 
9789535105763
Reliure
Relié
Nombre de pages
256
Éditeur
Nalladega Vijay
Coordonnées du fabricant
non disponible
Personne responsable
non disponible