Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope - Couverture rigide

Khursheed, Anjam

 
9789811227028: Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope
Couverture rigide
ISBN 10 : 9811227020 ISBN 13 : 9789811227028
Editeur : World Scientific Publishing Co Pte Ltd, 2020

Synopsis

<span style="color: rgba(0, 0, 0, 1)">This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpose of nanoscale topographic imaging. This book demonstrates the advantages of carrying out precision electron energy spectroscopy of its secondary electrons, in addition to them being used for imaging. The book will demonstrate how secondary electron energy spectroscopy can transform the SEM into a powerful analytical tool that can map valuable material science information to the nanoscale, superimposing it onto the instrument's normal topographic mode imaging. The book demonstrates how the SEM can then be used to quantify/identify materials, acquire bulk density of states information, capture dopant density distributions in semiconductor specimens, and map surface charge distributions.</span>





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Éditeur
World Scientific Publishing Co Pte Ltd
Date d'édition
2020
Langue
anglais
ISBN 10 
9811227020
ISBN 13 
9789811227028
Reliure
Relié
Nombre de pages
344
Coordonnées du fabricant
non disponible
Personne responsable
gpsr@libri.de
gpsr@libri.de

Friedensallee 273
Hamburg
22763
Allemagne