Articles liés à Practical Electron Microscopy of Lattice Defects

Practical Electron Microscopy of Lattice Defects - Couverture rigide

Saka, Hiroyasu

 
9789811234699: Practical Electron Microscopy of Lattice Defects

Synopsis

This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.

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À propos de l'auteur

Hiroyasu Saka has been Professor Emeritus of Nagoya University since 2005. He has been a visiting Professor at Aichi Institute of Technology since 2011. He was a Professor of Quantum Engineering at Nagoya University between 1988 and 2005. He received his PhD degree in Metallurgical Engineering from Nagoya University in 1972. He has been an Emeritus Fellow of the Japan Institute of Metals and Materials since 2005. He has also been a member of the Japanese Society of Microscopy since 1966.

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