Reliability and Radiation Effects in Compound Semiconductors - Couverture rigide

Johnston, Allan H

 
9789814277105: Reliability and Radiation Effects in Compound Semiconductors
Couverture rigide
ISBN 10 : 981427710X ISBN 13 : 9789814277105
Editeur : World Scientific Publishing Co Pte Ltd, 2010

Synopsis

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
World Scientific Publishing Co Pte Ltd
Date d'édition
2010
Langue
anglais
ISBN 10 
981427710X
ISBN 13 
9789814277105
Reliure
Relié
Nombre de pages
376
Coordonnées du fabricant
non disponible
Personne responsable
non disponible

Autres éditions populaires du même titre

9789814277112: Reliability and Radiation Effects in Compound Semiconductors

Edition présentée

ISBN 10 :  9814277118 ISBN 13 :  9789814277112
Editeur : World Scientific Pub Co Inc, 2010
Couverture rigide