Fundamentals Of Atomic Force Microscopy - Part I: Foundations - Couverture souple

Livre 4 sur 9: Lessons From Nanoscience: A Lecture Notes

Reifenberger, Ronald G

 
9789814630351: Fundamentals Of Atomic Force Microscopy - Part I: Foundations
Couverture souple
ISBN 10 : 9814630357 ISBN 13 : 9789814630351
Editeur : Wspc, 2015

Synopsis

"The overall structure of the book is excellent. It gives a good description of supplementary information needed for the average graduate student to understand the physics of Atomic Force Microscopy." Mrs Bulletin The atomic force microscope (Afm) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an Afm. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an Afm. Useful as a study guide to “Fundamentals of Afm”, an online video course available at https://nanohub.org/courses/Afm1/ Suitable for Graduate/Undergraduate Independent Reading and Research Course in Afm (with the combination of book and online videos)

Les informations fournies dans la section « Synopsis » peuvent faire référence à une autre édition de ce titre.

Présentation de l'éditeur

"The overall structure of the book is excellent. It gives a good description of supplementary information needed for the average graduate student to understand the physics of Atomic Force Microscopy." Mrs Bulletin The atomic force microscope (Afm) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an Afm. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an Afm. Useful as a study guide to “Fundamentals of Afm”, an online video course available at https://nanohub.org/courses/Afm1/ Suitable for Graduate/Undergraduate Independent Reading and Research Course in Afm (with the combination of book and online videos)

Présentation de l'éditeur

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.

Useful as a study guide to Fundamentals of AFM, an online video course available at https://nanohub.org/courses/AFM1/

Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)

Les informations fournies dans la section « A propos du livre » peuvent faire référence à une autre édition de ce titre.

Éditeur
Wspc
Date d'édition
2015
Langue
anglais
ISBN 10 
9814630357
ISBN 13 
9789814630351
Reliure
Broché
Nombre de pages
340
Coordonnées du fabricant
non disponible
Personne responsable
gpsr@libri.de
gpsr@libri.de

Friedensallee 273
Hamburg
22763
Allemagne

Autres éditions populaires du même titre

9789814630344: Fundamentals of Atomic Force Microscopy: Foundations

Edition présentée

ISBN 10 :  9814630349 ISBN 13 :  9789814630344
Editeur : World Scientific Publishing Co P..., 2015
Couverture rigide