Advances in Texture, Microtexture, and Allied Techniques: Measurements, Analyses, and Application - Couverture rigide

Couverture rigide

ISBN 10 : 9819653452 ISBN 13 : 9789819653454

Editeur : Springer Nature Switzerland AG, 2025

Synopsis

This book presents the fundamentals of texture and microtexture with the latest developments in the field and relates the same for different materials and processes. Crystallographic phase and orientation define the anisotropy of crystalline materials. In polycrystalline materials, the preferred crystallographic orientation of grain distributions, also known as (crystallographic) texture, controls the properties of materials. The evaluation of texture has been traditionally carried out by X-ray diffraction and neutron diffraction. In recent times, microtexture-based techniques have been widely used not only to examine the crystallographic texture but also to investigate the micro-mechanisms controlling the development of texture and microstructure. It has, therefore, become almost mandatory to re-visit the physical phenomenon associated with materials from the viewpoint of microtexture. The individual chapters have been written by the renowned scientists working in the respective domain. The book can be a valuable reference for researchers and professionals interested in fundamentals of texture and microtexture and allied fields.

A propos du livre

À propos de l'auteur

Satyam Suwas is a professor and chair of Materials Engineering at Indian Institute of Science, Bangalore, India. He obtained his Ph.D. in Materials and Metallurgical Engineering from IIT Kanpur and worked at Defence Metallurgical Research Laboratory, Hyderabad; University of Lorraine, France and RWTH Aachen, Germany before joining Indian Institute of Science. His specialization includes materials processing, crystallographic texture and mechanical behaviour of materials. He is a Humboldt fellow and has also been conferred with the Friedrich Wilhelm Bessel Research Award by the Humboldt foundation, Germany. He serves as editorial board member of many journals, and is the associate editor for Materials Characterization, and Current Science.
David P. Field is a professor in the School of Mechanical and Materials Engineering, and the director of the Institute of Materials Research at Washington State University. He received his Ph.D. in Mechanical Engineering in 1991 from Yale University. From 1990 to 2000 he was employed as a Sr. engineer at Alcoa Technical Center and then as the director of Technology at TexSEM Laboratories. He joined Washington State University in 2000. He has served in many editorial capacities and is currently the Editor-in-Chief of Materials Characterization. His research interest focusses upon the statistical description of microstructures with emphasis on polycrystalline materials including metals, ceramics, and electronic materials.

Détails de l'édition

• Éditeur: Springer Nature Switzerland AG
• Date d'édition: 2025
• Langue: anglais
• ISBN 10: 9819653452
• ISBN 13: 9789819653454
• Reliure: Relié
• Nombre de pages: 373
• Éditeur: Suwas Satyam, Field David P.
• Coordonnées du fabricant: GPSR Kontakt; ProductSafety@springernature.com; ; Tiergartenstr. 17; Heidelberg; 69121; Allemagne