Praise for the Second Edition:
... a very well-presented book, covering the classic topics of inspection sampling in a thorough, lucid and insightful way. ... [It] is an elegant and comprehensive resource for the knowledgeable user, and so well written that the beginner will also find it congenial and rewarding...
-John Shade, Journal of the Royal Statistical Society
[The] first edition of Acceptance Sampling in Quality Control is a classic, and is considered by many as a "must have book" for anyone working in quality control. ... With the current expectations of continuous improvement, [and] rigorous process control ...some may tend to think that acceptance sampling is not as important as it was in the past. However, with a world economy and ever improving technology, the relationship between customers and suppliers has changed dramatically with distance, cultures, and language all having an impact. This makes acceptance sampling as important as ever and this book as relevant as ever.
-Theresa L. Utlaut, Journal of Quality Technology
Acceptance Sampling in Quality Control, Third Edition presents the state of the art in the methodology of sampling while integrating both theory and best practices. It discusses various standards, including those from the ISO, MIL-STD and ASTM and explores how to set quality levels. The book also includes problems at the end of each chapter with solutions. This edition improves upon the previous editions especially in the areas of software applications and compliance sampling plans.
New to the Third Edition:
- Numerous Microsoft Excel templates to address sampling plans are used.
- Commercial software applications are discussed at the end of many chapters.
- Discussion of quick switching systems has been expanded to account for the considerable recent activity in this area.
- Added discussion of zero acceptance number chained quick switching systems.
Dr. Edward G. Schilling was a professor emeritus of statistics at the Center for Quality and Applied Statistics, at Rochester Institute of Technology (RIT), where he had been the director of the center and the chair of the Graduate Statistics Department.
Before joining RIT, he was the manager of the lighting quality operation for the Lighting Business Group of General Electric Company. He received his BA and MBA from State University of New York (SUNY) at Buffalo, and his MS and PhD in statistics from Rutgers University. He had been on the faculties of SUNY at Buffalo, Rutgers University, and Case Western Reserve University. He had extensive industrial experience in quality engineering at Radio Corporation of America (RCA) and the Carborundum Co., and in statistical consulting and quality management at General Electric. Dr. Schilling was a fellow of the American Society for Quality (ASQ), the American Statistical Association (ASA), and the American Society for Testing and Materials (ASTM). He was also a member of the Institute of Mathematical Statistics and the American Economic Association. He was registered as a professional engineer in California and certified by ASQ as a quality and a reliability engineer. He served as the founding series editor for the Marcel Dekker series of books on quality and reliability, and published extensively in the field of quality
control and statistics.
Dr. Schilling was the Shewhart Medalist in 1983, the recipient of the E.L. Grant Award in 1999, the Freund-Marquardt Medal in 2005, and the Distinguished Service Medal in 2002; he was the first person to receive the Brumbaugh Award four times from the ASQ. He was also the recipient of the Ellis R. Ott Award in 1984 for his contributions to quality management from the Metropolitan New York Section of that society and was honored by being invited to present the 1986 W.J. Youden Memorial Address at the Joint ASQ/ASA Annual Fall Technical Conference. He was the recipient of the H.F. Dodge Award by the ASTM in 1993 and the Award of Merit in 2002.
Dr. Schilling was an associate editor of the fifth edition of Juran's Quality Control Handbook. His book, Process Quality Control (with E.R. Ott and D.V. Neubauer), is among the leading texts in the field.
Dean V. Neubauer
is an Engineering Fellow in the Process Engineering Directorate in the Manufacturing, Technology and Engineering (MTE) Division at Corning Incorporated. He has worked for Corning since 1981 and has been involved in projects in every major business over this time. He has fifteen U.S. patents for compositional work on a variety of materials and devices for the manufacture of display glass. His background includes degrees in statistics from Iowa State University and Rochester Institute of Technology.
Outside of Corning, Dean has taught as an Adjunct Professor in the M.S. program for the Center for Quality and Applied Statistics at R.I.T. since 1992. He also participates on the ASTM E-11 Committee on Quality and Statistics where he is a Past Chairman and is a member of the ASTM International Committee on Standards (COS). Dean is a book reviewer for the Technometrics and Journal of Quality Technology journals, serves on the Management Committee of the Technometrics journal, serves on the Editorial Board of the Quality Engineering journal, is the co-author of Process Quality Control, 4th Edition with the late Dr. Edward G. Schilling. He is also a former U.S. Lead Delegate to the ISO Technical Committee 69 on Statistical Methods Subcommittee SC5 on Acceptance Sampling. In this role, he was responsible for the review of ISO, as well as, ANSI/ASQ Z acceptance sampling standards.
Dean was elected a Fellow of the American Society for Quality (ASQ) in 2000 and is a Certified Quality Engineer. Dean is also a Past Chair of the ASQ's Chemical and Process Industries Division and a Past Chair of the Corning-Elmira ASQ Section. He is a recipient of the 2003 Shewell Award from ASQ and the 2011 Harold F. Dodge Award from ASTM. He has also been a Member of the American Statistical Association since 1979 and is an accredited professional statistician (PStat(TM)). In 1993, he was elected a Fellow of the Royal Statistical Society in London, England and holds the certification of Chartered Statistician (CStat). In 2010, he was given the Award of Merit carrying the title of Fellow from the American Society for Testing Materials (ASTM).
