Accuracy in Trace Analysis: Sampling, Sample Handling, Analysis, Volume 2: Proceedings of the 7th Materials Research Symposium

LaFleur, Philip D., editor

Edité par U.S. Department of Commerce, 1976

A propos de cet article

Hardcover, Volume 2 only; NBS Special Publication 422; proceedings held at the National Bureau of Standards in Gaithersburg, Maryland, October 7-11, 1974; light fading, light shelf wear to exterior; otherwise in very good condition with clean text, firm binding.

N° de réf. du vendeur 78374

Détails bibliographiques

• Titre: Accuracy in Trace Analysis: Sampling, Sample Handling, Analysis, Volume 2: Proceedings of the 7th Materials Research Symposium
• Éditeur: U.S. Department of Commerce
• Date de parution: 1976
• Reliure: Hardcover
• État de l'article: UsedVeryGood