Advanced Mathematical And Computational Tools In Metrology And Testing Xii (Series On Advances In Mathematics For Applied Sciences)

By A G Chunovkina (Editor), F Pavese (Editor), N F Zhang (Editor), A B Forbes (Editor),

ISBN 10: 9811242372 / ISBN 13: 9789811242373

Edité par WSPC, 2022

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This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide. N° de réf. du vendeur ABNR-145849

Détails bibliographiques

Titre : Advanced Mathematical And Computational ...

Éditeur : WSPC

Date d'édition : 2022

Reliure : Couverture rigide

Etat : New

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Synopsis :

This volume contains original, refereed contributions by researchers from national metrology institutes, universities and laboratories across the world involved in metrology and testing. The volume has been produced by the International Measurement Confederation Technical Committee 21, Mathematical Tools for Measurements and is the twelfth in the series. The papers cover topics in numerical analysis and computational tools, statistical inference, regression, calibration and metrological traceability, computer science and data provenance, and describe applications in a wide range of application domains. This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. It will also be of interest to scientists and engineers concerned with the reliability, trustworthiness and reproducibility of data and data analytics in data-driven systems in engineering, environmental and life sciences.