Advances in Data and Web Management: Joint International Conferences, APWeb/WAIM 2009, Suzhou, China, April 2-4, 2009, Proceedings (Lecture Notes in Computer Science)

ISBN 10: 364200671X / ISBN 13: 9783642006715

Edité par Springer, 2009

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Like New. N° de réf. du vendeur D7F0-4-M-364200671X-5

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Titre : Advances in Data and Web Management: Joint ...

Éditeur : Springer

Date d'édition : 2009

Reliure : Paperback

Etat : Like New

Type de livre : book

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Synopsis :

APWeb and WAIM are two leading international conferences on the research, development, and applications of Web technologies, database systems, infor- tion management and software engineering, with a focus on the Asia-Paci?c - gion. The previous APWeb conferences were held in Beijing (1998), Hong Kong (1999), Xi'an (2000), Changsha (2001), Xi'an (2003), Hangzhou (2004), Sha- hai (2005), Harbin (2006), Huangshan (2007), and Shenyang (2008); and the previous WAIM conferences were held in Shanghai (2000), Xi'an (2001), Beijing (2002), Chengdu (2003), Dalian (2004), Hangzhou (2005), Hong Kong (2006), Huangshan (2007), and Zhangjiajie (2008). For the second time, APWeb and WAIM were combined to foster closer collaboration and research idea sharing, and were held immediately after IEEE ICDE 2009 in Shanghai. This high-quality programwould not have been possible without the authors who chose APWeb+WAIM as a venue for their publications. Out of 189 subm- ted papers from 21 countries and regions, including Australia, Austria, Bengal, Brazil, Canada, France, Greece, Hong Kong, India, Iran, Japan, Korea, Macau, Mainland China, Myanmar, The Netherlands, Norway, Taiwan, Thailand, UK, and USA, we selected 42 full papers and 26 short papers for publication. The acceptancerate for regular full papers is 22%.The contributed papers addressed a wide scope of issues in the ?elds of Web-age information management and advanced applications, including Web data mining, knowledge discovery from streaming data, query processing, multidimensional data analysis, data mana- ment support to advanced applications, etc.